Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour - Archive ouverte HAL
Communication Dans Un Congrès Année : 2005

Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour

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Dates et versions

hal-00133673 , version 1 (27-02-2007)

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  • HAL Id : hal-00133673 , version 1

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Jean Louis Chaboche, Eva Heripre, Arjen Roos, Jerome Crepin. Combination of computational crystal plasticity modelling and microstrain field measurements techniques for the analysis of TiAl behaviour. ASME McMAt 2005, Jun 2005, Baton Rouge, United States. ⟨hal-00133673⟩
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