Influence of orientation, thickness and Nb doping on the structural, microstructural and electrical properties of PZT thin films - Archive ouverte HAL
Chapitre D'ouvrage Année : 2003

Influence of orientation, thickness and Nb doping on the structural, microstructural and electrical properties of PZT thin films

Denis Remiens
T. Haccart
  • Fonction : Auteur
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hal-00132002 , version 1 (20-02-2007)

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  • HAL Id : hal-00132002 , version 1

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Eric Cattan, Denis Remiens, T. Haccart. Influence of orientation, thickness and Nb doping on the structural, microstructural and electrical properties of PZT thin films. REMIENS D. Recent research developments in piezoelectric materials for macro/micro systems, Research Signpost, Kerala, India, pp.129-158, 2003. ⟨hal-00132002⟩
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