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Journal Articles SIAM Journal on Applied Mathematics Year : 2008

Electrical Impedance Tomography by Elastic Deformation

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Abstract

This paper presents a new algorithm for conductivity imaging. Our idea is to extract more information about the conductivity distribution from data that have been enriched by coupling impedance electrical measurements to localized elastic perturbations. Using asymtotics of the fields in the presence of small volume inclusions, we relate the pointwise values of the energy density to the measured data, through a nonlinear PDE. Our algorithm is based on this PDE and takes full advantage of the enriched data. We give numerical examples that illustrate the performance and the accuracy of our approach.
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Dates and versions

hal-00128366 , version 1 (31-01-2007)
hal-00128366 , version 2 (04-02-2007)

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Cite

Habib Ammari, Eric Bonnetier, Yves Capdeboscq, Mickael Tanter, Mathias Fink. Electrical Impedance Tomography by Elastic Deformation. SIAM Journal on Applied Mathematics, 2008, 68 (6), pp.1557-1573. ⟨10.1137/070686408⟩. ⟨hal-00128366v2⟩
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