Relationship between structure, segregation and electrical activity in grain boundaries - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Materials Science Année : 2005

Relationship between structure, segregation and electrical activity in grain boundaries

A. Lamzatouar
  • Fonction : Auteur
Olivier Palais
J. Thibault
  • Fonction : Auteur
A. Charaï
  • Fonction : Auteur

Résumé

Using the contactless microwave phase-shift technique (μ W-PS) and High Resolution Transmission Electron Microscopy (HRTEM), we show that the twist and mixed parts of a < 110 > Σ = 51(θ = 16.10∘) grain boundary in germanium (Ge) are electrically active. We also show that we can passivate the electrically active grain boundaries by sulfur segregation which has been studied by energy filtering HRTEM. Atomistic simulations show that the most favorable places for this segregation are the high energy sites of grain boundary
Fichier non déposé

Dates et versions

hal-00096918 , version 1 (20-09-2006)

Identifiants

  • HAL Id : hal-00096918 , version 1

Citer

A. Lamzatouar, Olivier Palais, O. B. M. Hardouin Duparc, J. Thibault, A. Charaï. Relationship between structure, segregation and electrical activity in grain boundaries. Journal of Materials Science, 2005, 40, pp.3163-3167. ⟨hal-00096918⟩
87 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More