Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility - Archive ouverte HAL
Communication Dans Un Congrès Année : 2004

Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility

Résumé

After a brief introduction to the NIST EBIT facility, we present the results of three different types of experiments that have been carried out there recently: EUV and visible spectroscopy in support of the microelectronics industry, laboratory astrophysics using an x-ray microcalorimeter, and charge exchange studies using extracted beams of highly charged ions.
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Dates et versions

hal-00020866 , version 1 (15-03-2006)

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J. D. Gillaspy, B. Blagojevic, A. Dalgarno, K. Fahey, V. Kharchenko, et al.. Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility. 14th APS Topical Conference on Atomic Processes in Plasmas, 2004, Santa Fe, New Mexico, United States. pp.245. ⟨hal-00020866⟩
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