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Article Dans Une Revue Analog Integrated Circuits and Signal Processing Année : 2001

Microbeams with electronically controlled high thermal impedance

Résumé

In some MEMS (micro-electro-mechanical systems) applications, a tradeoff must be reached between the mechanical strength of a suspended microstructure and the thermal losses through the support beams. This is typically the case of suspended thermal MEMS, a major domain of application of CMOS-compatible bulk-micromachining technologies. This paper illustrates how suspended MEMS can be strengthened by means of additional support beams which can have a very high thermal impedance, thus having a very small impact in the thermal behavior of the microstructure. The high thermal impedance of a support beam is achieved through self-heating: an electronic control monitors the temperature drop and heats up the beam to reduce the heat flow. The control electronics of a beam is implemented using a single high-gain stage with auto-zeroing. A high thermal impedance beam (HTIB) can be considered as a new MEMS design cell. We illustrate the use of this cell in the design of an electro-thermal converter with long time constant, requiring several HTIB cells which can share the same control electronics. A single low-frequency high-gain stage is used, achieving 60 dB DC gain and DC offset and broadband noise below 100 mu V, which is suitable for ETC application.

Dates et versions

hal-00012882 , version 1 (28-10-2005)

Identifiants

Citer

Salvador Mir, F. Parrain, B. Charlot, D. Veychard. Microbeams with electronically controlled high thermal impedance. Analog Integrated Circuits and Signal Processing, 2001, 29(1-2), pp.71-83. ⟨10.1023/A:1011282314105⟩. ⟨hal-00012882⟩

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