Memory Built-In Self-Repair for Nanotechnologies - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2003

Memory Built-In Self-Repair for Nanotechnologies

Résumé

This paper presents memory Built-In Self-Repair approaches allowing to achieve high yield for defect densities several orders of magnitude higher than in current technologies. Such repair schemes illustrate that we could built memories in nanoelectronic technologies that are subject to very high defect densities.

Mots clés

Fichier non déposé

Dates et versions

hal-00005831 , version 1 (05-07-2005)

Identifiants

Citer

M. Nicolaidis, M.N. Achouri, Lorena Anghel. Memory Built-In Self-Repair for Nanotechnologies. 9th IEEE International On-Line Testing Symposium, 2003, Kos International Convention Center, Kos Island, Greece. pp.94-8, ⟨10.1109/OLT.2003.1214373⟩. ⟨hal-00005831⟩

Collections

UGA CNRS TIMA
73 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More