Raman microspectroscopic characterization of amorphous silica plastic behavior - Archive ouverte HAL
Article Dans Une Revue Journal of the American Ceramic Society Année : 2006

Raman microspectroscopic characterization of amorphous silica plastic behavior

Résumé

Raman microspectroscopy was used to characterize amorphous silica plastic behavior. Using a correlation between Raman spectrum and density, a map of the local residual indentation-induced densification is obtained. The existence of a densification-induced hardening is also evidenced through a diamond anvil cell experiment. Such observations are not accounted for by the previously proposed hardening-free pressure-dependent yield criterion based on indentation curves. These results open the way to more accurate description of a constitutive law for amorphous silica.

Mots clés

Fichier principal
Vignette du fichier
AP-jacs06.pdf (351.24 Ko) Télécharger le fichier

Dates et versions

hal-00002965 , version 1 (28-09-2004)
hal-00002965 , version 2 (02-02-2006)

Identifiants

Citer

Antoine Perriot, Valérie Martinez, Laurent Grosvalet, Christine Martinet, Bernard Champagnon, et al.. Raman microspectroscopic characterization of amorphous silica plastic behavior. Journal of the American Ceramic Society, 2006, 89, pp.596. ⟨10.1111/j.1551-2916.2005.00747.x⟩. ⟨hal-00002965v2⟩
108 Consultations
313 Téléchargements

Altmetric

Partager

More