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Article Dans Une Revue Physical Review Letters Année : 2002

Measuring surface stress discontinuities in self-organized systems with X rays

Geoffroy Prévot
M. Sotto
  • Fonction : Auteur
Y. Garreau
  • Fonction : Auteur
R. Pinchaux
  • Fonction : Auteur
M. Sauvage-Simkin
  • Fonction : Auteur

Résumé

We have performed a grazing incidence x-ray diffraction study of the self-organized N/Cu(001) system. Diffraction satellites associated with self-organization are particularly intense around Bragg conditions of the bulk crystal. Bulk elastic relaxations due to surface stress discontinuities at domain boundaries are responsible for this feature. A quantitative analysis shows that these relaxations, computed by molecular dynamics or continuum elasticity, explain very well the whole diffraction study. A difference in surface stress of 7 N m-1 between uncovered and N-covered regions of the Cu surface is shown to be the driving force for self-organization
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Dates et versions

hal-00002622 , version 1 (06-09-2004)

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B. Croset, Y. Girard, Geoffroy Prévot, M. Sotto, Y. Garreau, et al.. Measuring surface stress discontinuities in self-organized systems with X rays. Physical Review Letters, 2002, 88, pp.056103. ⟨10.1103/PhysRevLett.88.056103⟩. ⟨hal-00002622⟩
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