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Derniers dépôts
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Nombre de documents
77
Nombre de notices
276
Mots-clés
Transmission electron microscopy
NEXAFS
Carbon
Oxides
Vanadium Sesquioxide
Calcined clay
Carbon nanotubes
A Multilayers
Nanotubes
Scanning electron microscopy
Plasmas froids
V2O3
Anatase
Kirkendall effect
TiO2
Titanium dioxide
CH4
Bixbyite
CHLORINE PLASMAS
X-ray diffraction
Copper
Sol-gel
Functionalization
Buffer Couple
Aryl-diazonium salts
Selenization
Amyloid precursor
Magnetron sputtering
Optical properties
Capacitance
AZO thin films
Carbon Nanotube
C Photoelectron spectroscopy
SF 6
Band gap
Avalanche breakdown
Chalcogenides
Thin film
CaTiO3Pr^3^+
Residual stress
Etching
Biomasse
Alzheimer's disease
Sputtering
Ablation laser
Ambipolar material
Applications industrielles
B3 Solar cells
A-CNx
Physical vapor deposition
PECVD
Aluminium nitride
Mott insulator
Mott insulators
B2 Semiconducting alloys
Biocapteurs
Nanocomposite
XPS
CNTs’ collapse
Transfert d'énergie
Alloying
Non-volatile memory
A Chalcogenides
Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation
Films
Chalcogenide
TEM
B2 Semiconducting indium compounds
B2 Quaternary
CIGSe
Band alignment
Cathepsin
Low-pressure plasma processing
Spectroscopic ellipsometry
Carbon nitride
Semiconductors
Biofilms microbiens
BOMBARDMENT
Adsorption
A Thin films
Amorphous
Colloidal solution
Plasma etching
B1 Inorganic compounds
Atomic force microscopy
A1 Characterization
Chemical detection
Atomic layer etching
A3 Physical vapor deposition processes
Bipolar resistive switching BRS
AuCu alloy
AlN
X-ray photoelectron spectroscopy
Chalcogenide glass
3 nm in size
Structure
Thin films
Chemical and biological sensors
B Chemical synthesis
Resistive switching