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Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories
Julien Coutet
,
Francois Marc
,
Flavien Dozolme
,
Romain Guétard
,
Aurélien Janvresse
et al.
Journal articles
hal-01946449v1
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A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions
C. Mukherjee
,
F. Marc
,
M. Couret
,
G.G. Fischer
,
M. Jaoul
et al.
Journal articles
hal-02475429v1
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Improvement of ageing simulation of electronic circuits based on behavioural modelling
François Marc
,
Benoit Mongellaz
,
Corinne Bestory
,
Herve Levi
,
Yves Danto
et al.
IPFA 2005, 2005, Singapore. pp.195-199
Conference papers
hal-00181897v1
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Modèle Comportemental VHDL-AMS d'un Amplificateur CMOS à Transconductance: Application à la conception de filtres
Benoit Mongellaz
,
Anne Schmitt
,
Noëlle Lewis
,
François Marc
,
Yves Danto
et al.
SETIT 2003, 2003, Tunisie. pp.1
Conference papers
hal-00181901v1
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System Level Analysis and Accurate Prediction of Electromigration
Tushar Gupta
,
Clément Bertolini
,
Olivier Héron
,
Nicolas Ventroux
,
Thomas Zimmer
et al.
European Workshop on CMOS Variability (VARI), May 2011, Grenoble, France. pp.1
Conference papers
hal-00674319v1
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Thermal aging model of InP/InGaAs/InP DHBT
S. Ghosh
,
F. Marc
,
C. Maneux
,
B. Grandchamp
,
G. A. Koné
et al.
Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, Oct 2010, gaeta, Italy. pp.1-4
Conference papers
hal-01002465v1
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Preliminary results of storage accelerated aging test on InP/InGaAs DHBT
Gilles Amadou Koné
,
Brice Grandchamp
,
Cyril Hainaut
,
François Marc
,
Cristell Maneux
et al.
Journal articles
hal-00585073v1
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Proceedings of 24th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2013 (Special issue of Microelectronics Reliability, Vol. 53, Issues 9-11) (2013)
Nathalie Labat
,
François Marc
Elsevier, pp.650, 2013
Books
hal-00995849v1
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Modélisation comportementale de la fiabilité des circuits intégrés complexes
François Marc
,
Benoit Mongellaz
,
Yves Danto
RTP Fiabilité, 2004, France
Conference papers
hal-00181918v1
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A general methodology using an electron beam tester applied to failure localization inside a logic integrated circuit
François Marc
,
Hélène Fremont
,
Paul Jounet
,
M. Barre
,
Yves Danto
et al.
Microelectronic Engineering, 1995, 26, pp.181-193
Journal articles
hal-00181885v1
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Study of Degradations in PCB Interconnections for High Frequency Applications
Geneviève Duchamp
,
Frédéric Verdier
,
Bruno Levrier
,
François Marc
,
Yves Ousten
et al.
IPFA 2005, 2005, Singapore. pp.253-257
Conference papers
hal-00181898v1
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Preliminary results of storage accelerated aging test on InP/GaAsSb DHBT
Gilles Amadou Kone
,
S. Ghosh
,
Brice Grandchamp
,
Cristell Maneux
,
François Marc
et al.
International Conference on Indium Phosphide and Related Materials (IPRM 2011), May 2011, Berlin, Germany. pp.1
Conference papers
hal-00585590v1
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Improvement of Aging Simulation of Electronic Circuits Using Behavioral Modeling
François Marc
,
Benoit Mongellaz
,
Corinne Bestory
,
Herve Levi
,
Yves Danto
et al.
IEEE Transactions on Device and Materials Reliability, 2006, 1, pp.228-234
Journal articles
hal-00181801v1
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Use of Genetic Algorithm for Efficient Integrated Circuits Compact Modelling and Parameter Extraction
Bertrand Ardouin
,
Thomas Zimmer
,
Jean Batiste Duluc
,
Francois Marc
,
Pascal Fouillat
et al.
ACIDCA'2000, Mar 2000, Monastir, Tunisia. pp._
Conference papers
hal-00189377v1
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Functionnal localization in integrated circuits by Signal Selective Voltage Contrast in a scanning electron microscope
François Marc
,
Hélène Frémont
,
Paul Jounet
,
Yves Danto
,
Michel Barré
et al.
Microelectronics Reliability, 1994, 24, pp.295-301
Journal articles
hal-00326620v1
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Predicting Lifetime using power consumption from 'Wattch
Tushar Gupta
,
Clément Bertolini
,
Olivier Héron
,
Nicolas Ventroux
,
Thomas Zimmer
et al.
6th International Summer School on Adv. Computer Arch. and Compilation for Embedded Systems, ACACES, Jul 2010, Terrassa, Spain. pp. 197-198
Conference papers
hal-00674317v1
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Modelling delay degradation due to NBTI in FPGA Look-up tables
Mohammad Naouss
,
François Marc
26th International Conference on Field Programmable Logic and Applications (FPL 2016) , Aug 2016, Lausanne, Switzerland. ⟨10.1109/FPL.2016.7577328⟩
Conference papers
hal-01661828v1
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Multilevel behavioural modelling for reliability analysis of ionizing dose effects on a n-MOS simple current mirror
Corinne Bestory
,
François Marc
,
Sophie Duzellier
,
Hervé Lévi
Journal articles
hal-00499470v1
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Statistical analysis during the reliability simulation
Corinne Bestory
,
François Marc
,
Hervé Lévi
Journal articles
istex
hal-00326542v1
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On the Simulation of HCI-Induced Variations of IC Timings at High Level
Olivier Héron
,
Clément Bertolini
,
Nicolas Ventroux
,
Chiara Sandionigi
,
François Marc
et al.
Journal articles
istex
hal-00950233v1
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Proceedings of 22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2011 (Special issue of Microelectronics Reliability, Vol. 51, Issues 9-11)
Nathalie Labat
,
François Marc
Elsevier, pp.600, 2011
Books
hal-00670461v1
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CMOS transistor electrical ageing experiments to build VHDL-AMS behavioral models
Benoit Mongellaz
,
François Marc
,
Yves Danto
IEEE International Reliability Physics Symposium (IRPS) 2004, 2004, United States. pp.1
Conference papers
hal-00181900v1
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Reliability of submicron InGaAs/InP DHBT on Accelerated Aging Tests under Thermal and Electrical stresses
G. A. Koné
,
B. Grandchamp
,
C. Hainaut
,
F. Marc
,
C. Maneux
et al.
22th European Symposium on the RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Oct 2011, bordeaux, France. pp.1-4
Conference papers
hal-01002459v1
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Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design
S. Ghosh
,
B. Grandchamp
,
G. A. Koné
,
F. Marc
,
C. Maneux
et al.
22th European Symposium on the RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Oct 2011, bordeaux, France. pp.1-4
Conference papers
hal-01002192v1
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FPGA LUT delay degradation due to HCI: Experiment and simulation results
Mohammad Naouss
,
F. Marc
Journal articles
hal-01661820v1
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Conception fiabilisée pour les circuits à nanodispositifs
François Marc
Atelier du GDR Nanoélectronique / SOP-SIC - De la modélisation des nanodispositifs aux circuits innovants, Dec 2009, Bordeaux, France
Conference papers
hal-00499488v1
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Practical implementation of reliability aware compact models in simulation software environnement
Bertrand Ardouin
,
Zimmer Thomas
,
Jean-Yves Dupuy
,
Jean Godin
,
Virginie Nodjiadjim
et al.
Bipolar ArbeitsKreis, Nov 2017, Erfurt, Germany
Conference papers
hal-02511647v1
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CAD of evanescent mode waveguide filter with genetic algorithm optimization
Marc Lecouve
,
Nicolas Boutheiller
,
Pierre Jarry
,
Eric Kerherve
,
François Marc
et al.
IEEE Microwaves Symposium 2000, 2000, Maroc. pp.1
Conference papers
hal-00181905v1
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A CMOS Analogue Function VHDL-AMS Behavioral Ageing Model
Benoit Mongellaz
,
François Marc
,
Corinne Bestory
,
Yves Danto
IEEE International Symposium on Industrial Electronics (ISIE) 2004, 2004, France. pp.1
Conference papers
hal-00181899v1
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Algorithme génétique adapté à la conception d'un filtre en guide d'ondes à modes évanescents
Marc Lecouve
,
Nicolas Boutheiller
,
Pierre Jarry
,
Eric Kerherve
,
François Marc
et al.
NUMELEC'2000, Conférence Européenne sur les Méthodes Numériques en Electromagnétisme, 2000, France. pp.102-103
Conference papers
hal-00181904v1
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