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Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories

Julien Coutet , Francois Marc , Flavien Dozolme , Romain Guétard , Aurélien Janvresse et al.
Microelectronics Reliability, 2018, 88-90, pp.61-66. ⟨10.1016/j.microrel.2018.06.088⟩
Journal articles hal-01946449v1
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A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions

C. Mukherjee , F. Marc , M. Couret , G.G. Fischer , M. Jaoul et al.
Solid-State Electronics, 2020, 163, pp.107635. ⟨10.1016/j.sse.2019.107635⟩
Journal articles hal-02475429v1

Improvement of ageing simulation of electronic circuits based on behavioural modelling

François Marc , Benoit Mongellaz , Corinne Bestory , Herve Levi , Yves Danto et al.
IPFA 2005, 2005, Singapore. pp.195-199
Conference papers hal-00181897v1

Modèle Comportemental VHDL-AMS d'un Amplificateur CMOS à Transconductance: Application à la conception de filtres

Benoit Mongellaz , Anne Schmitt , Noëlle Lewis , François Marc , Yves Danto et al.
SETIT 2003, 2003, Tunisie. pp.1
Conference papers hal-00181901v1

System Level Analysis and Accurate Prediction of Electromigration

Tushar Gupta , Clément Bertolini , Olivier Héron , Nicolas Ventroux , Thomas Zimmer et al.
European Workshop on CMOS Variability (VARI), May 2011, Grenoble, France. pp.1
Conference papers hal-00674319v1

Thermal aging model of InP/InGaAs/InP DHBT

S. Ghosh , F. Marc , C. Maneux , B. Grandchamp , G. A. Koné et al.
Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, Oct 2010, gaeta, Italy. pp.1-4
Conference papers hal-01002465v1

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT

Gilles Amadou Koné , Brice Grandchamp , Cyril Hainaut , François Marc , Cristell Maneux et al.
Microelectronics Reliability, 2010, 50, pp.1548-1553. ⟨10.1016/j.microrel.2010.07.141⟩
Journal articles hal-00585073v1

Proceedings of 24th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2013 (Special issue of Microelectronics Reliability, Vol. 53, Issues 9-11) (2013)

Nathalie Labat , François Marc
Elsevier, pp.650, 2013
Books hal-00995849v1

Modélisation comportementale de la fiabilité des circuits intégrés complexes

François Marc , Benoit Mongellaz , Yves Danto
RTP Fiabilité, 2004, France
Conference papers hal-00181918v1

A general methodology using an electron beam tester applied to failure localization inside a logic integrated circuit

François Marc , Hélène Fremont , Paul Jounet , M. Barre , Yves Danto et al.
Microelectronic Engineering, 1995, 26, pp.181-193
Journal articles hal-00181885v1

Study of Degradations in PCB Interconnections for High Frequency Applications

Geneviève Duchamp , Frédéric Verdier , Bruno Levrier , François Marc , Yves Ousten et al.
IPFA 2005, 2005, Singapore. pp.253-257
Conference papers hal-00181898v1

Preliminary results of storage accelerated aging test on InP/GaAsSb DHBT

Gilles Amadou Kone , S. Ghosh , Brice Grandchamp , Cristell Maneux , François Marc et al.
International Conference on Indium Phosphide and Related Materials (IPRM 2011), May 2011, Berlin, Germany. pp.1
Conference papers hal-00585590v1

Improvement of Aging Simulation of Electronic Circuits Using Behavioral Modeling

François Marc , Benoit Mongellaz , Corinne Bestory , Herve Levi , Yves Danto et al.
IEEE Transactions on Device and Materials Reliability, 2006, 1, pp.228-234
Journal articles hal-00181801v1

Use of Genetic Algorithm for Efficient Integrated Circuits Compact Modelling and Parameter Extraction

Bertrand Ardouin , Thomas Zimmer , Jean Batiste Duluc , Francois Marc , Pascal Fouillat et al.
ACIDCA'2000, Mar 2000, Monastir, Tunisia. pp._
Conference papers hal-00189377v1

Functionnal localization in integrated circuits by Signal Selective Voltage Contrast in a scanning electron microscope

François Marc , Hélène Frémont , Paul Jounet , Yves Danto , Michel Barré et al.
Microelectronics Reliability, 1994, 24, pp.295-301
Journal articles hal-00326620v1

Predicting Lifetime using power consumption from 'Wattch

Tushar Gupta , Clément Bertolini , Olivier Héron , Nicolas Ventroux , Thomas Zimmer et al.
6th International Summer School on Adv. Computer Arch. and Compilation for Embedded Systems, ACACES, Jul 2010, Terrassa, Spain. pp. 197-198
Conference papers hal-00674317v1

Modelling delay degradation due to NBTI in FPGA Look-up tables

Mohammad Naouss , François Marc
26th International Conference on Field Programmable Logic and Applications (FPL 2016) , Aug 2016, Lausanne, Switzerland. ⟨10.1109/FPL.2016.7577328⟩
Conference papers hal-01661828v1

Multilevel behavioural modelling for reliability analysis of ionizing dose effects on a n-MOS simple current mirror

Corinne Bestory , François Marc , Sophie Duzellier , Hervé Lévi
Microelectronics Reliability, 2009, 49, pp.946-951. ⟨10.1016/j.microrel.2009.07.025⟩
Journal articles hal-00499470v1

Statistical analysis during the reliability simulation

Corinne Bestory , François Marc , Hervé Lévi
Microelectronics Reliability, 2007, 47, pp.1353-1357. ⟨10.1016/j.microrel.2007.07.079⟩
Journal articles istex hal-00326542v1

On the Simulation of HCI-Induced Variations of IC Timings at High Level

Olivier Héron , Clément Bertolini , Nicolas Ventroux , Chiara Sandionigi , François Marc et al.
Journal of Electronic Testing: : Theory and Applications, 2013, 29, pp.127-141. ⟨10.1007/s10836-013-5368-x⟩
Journal articles istex hal-00950233v1

Proceedings of 22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2011 (Special issue of Microelectronics Reliability, Vol. 51, Issues 9-11)

Nathalie Labat , François Marc
Elsevier, pp.600, 2011
Books hal-00670461v1

CMOS transistor electrical ageing experiments to build VHDL-AMS behavioral models

Benoit Mongellaz , François Marc , Yves Danto
IEEE International Reliability Physics Symposium (IRPS) 2004, 2004, United States. pp.1
Conference papers hal-00181900v1

Reliability of submicron InGaAs/InP DHBT on Accelerated Aging Tests under Thermal and Electrical stresses

G. A. Koné , B. Grandchamp , C. Hainaut , F. Marc , C. Maneux et al.
22th European Symposium on the RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Oct 2011, bordeaux, France. pp.1-4
Conference papers hal-01002459v1

Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design

S. Ghosh , B. Grandchamp , G. A. Koné , F. Marc , C. Maneux et al.
22th European Symposium on the RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Oct 2011, bordeaux, France. pp.1-4
Conference papers hal-01002192v1

FPGA LUT delay degradation due to HCI: Experiment and simulation results

Mohammad Naouss , F. Marc
Microelectronics Reliability, 2016, 64, pp.31 - 35. ⟨10.1016/j.microrel.2016.07.048⟩
Journal articles hal-01661820v1

Conception fiabilisée pour les circuits à nanodispositifs

François Marc
Atelier du GDR Nanoélectronique / SOP-SIC - De la modélisation des nanodispositifs aux circuits innovants, Dec 2009, Bordeaux, France
Conference papers hal-00499488v1

Practical implementation of reliability aware compact models in simulation software environnement

Bertrand Ardouin , Zimmer Thomas , Jean-Yves Dupuy , Jean Godin , Virginie Nodjiadjim et al.
Bipolar ArbeitsKreis, Nov 2017, Erfurt, Germany
Conference papers hal-02511647v1

CAD of evanescent mode waveguide filter with genetic algorithm optimization

Marc Lecouve , Nicolas Boutheiller , Pierre Jarry , Eric Kerherve , François Marc et al.
IEEE Microwaves Symposium 2000, 2000, Maroc. pp.1
Conference papers hal-00181905v1

A CMOS Analogue Function VHDL-AMS Behavioral Ageing Model

Benoit Mongellaz , François Marc , Corinne Bestory , Yves Danto
IEEE International Symposium on Industrial Electronics (ISIE) 2004, 2004, France. pp.1
Conference papers hal-00181899v1

Algorithme génétique adapté à la conception d'un filtre en guide d'ondes à modes évanescents

Marc Lecouve , Nicolas Boutheiller , Pierre Jarry , Eric Kerherve , François Marc et al.
NUMELEC'2000, Conférence Européenne sur les Méthodes Numériques en Electromagnétisme, 2000, France. pp.102-103
Conference papers hal-00181904v1