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Estimating Current Distributions in Power Semiconductor Dies Under Aging Conditions: Bond Wire Liftoff and Aluminum Reconstruction

Tien Anh Nguyen , Pierre-Yves Joubert , Stéphane Lefebvre , Denis Labrousse , Serge Bontemps
IEEE Transactions on Components Packaging and Manufacturing Technology Part B, 2015, 5 (4), pp.483 - 495. ⟨10.1109/TCPMT.2015.2406576⟩
Journal articles hal-01696121v1
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Modélisation électrothermique compacte des modes de défaillance du Mosfet SiC en régime extrême de court-circuit. Application au développement d'une protection intégrée pour convertisseur sécurisé à tolérance de panne

François Boige , Frédéric Richardeau , Stéphane Lefebvre
Symposium de Génie Électrique, Jul 2021, Nantes, France
Conference papers hal-03286429v1

Drops of water texture sprites

Sylvain Lefebvre
Wolfgang F. Engel. Shaderx2: Shader Programming Tips & Tricks with DirectX 9, Wordware Publishing, Inc., pp.190--206, 2003, 1556229887
Book sections inria-00537481v1

Imagerie électromagnétique sans contact de composant électronique de puissance à semi-conducteur

Tien Anh Nguyen , Pierre-Yves Joubert , Stéphane Lefebvre
Instrumentation Mesure et Métrologie, Imagerie des milieux naturels et artificiels, Lavoisier, 2012
Journal articles hal-01696155v1

Modes de vieillissement et de défaillance de modules IGBT sous cyclage actif à haute température

V. Smet , F. Forest , J.-J. Huselstein , Frédéric Richardeau , M. Berkani , et al.
Congrès national EPF2010, 2010, Saint Nazaire, France
Conference papers hal-01913792v1
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Pattern Based Procedural Textures

Sylvain Lefebvre , Fabrice Neyret
ACM-SIGGRAPH Symposium on Interactive 3D Graphics (I3D'03), ACM, Apr 2003, Monterey, United States. pp.203-212, ⟨10.1145/641480.641518⟩
Conference papers inria-00537476v1

Optimization of the Driver of GaN Power Transistors Through Measurement of Their Thermal Behavior

Lionel Hoffmann , Cyrille Gautier , Stéphane Lefebvre , François Costa
IEEE Transactions on Power Electronics, 2014, 29 (5), pp.2359 - 2366. ⟨10.1109/TPEL.2013.2277759⟩
Journal articles hal-01686023v1

Use of a full wave correct-by-design command to control a multilevel modular converter

Romain Soulat , Denis Labrousse , Gilles Feld , Bertrand Revol , Stéphane Lefebvre , et al.
2013 15th European Conference on Power Electronics and Applications (EPE), Sep 2013, Lille, France. ⟨10.1109/EPE.2013.6634448⟩
Conference papers hal-01686613v1

Comparison of modeling switching losses of an IGBT based on the datasheet and an experimentation

Dounia Oustad , Mickael Petit , Stéphane Lefebvre , Dominique Lhotellier , Menouar Ameziani
Power Electronics and Applications (EPE'16 ECCE Europe), Sep 2016, Karlsruhe, Germany. ⟨10.1109/EPE.2016.7695494⟩
Conference papers hal-01685763v1
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Development of testing methods for winding turn-to-turn insulation of low voltage motors fed by PWM converters

Veronika Bolgova , Stéphane Lefebvre , Sami Hlioui , Nidhal Boucenna , François Costa , et al.
19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe), 2017, Warsaw, Poland
Conference papers hal-01657565v1

Méthodes d'essais d'isolation entre spires des enroulements de machines électriques alimentés par des convertisseurs de tension

Veronika Bolgova , Sami Hlioui , Stéphane Lefebvre , Andrey Leonov
JCGE, 2017, ARRAS, France
Conference papers hal-01657588v1

Composants bipolaires (thyristors, triacs, GTO, GCT et BJT) : circuits de commande

S. Lefebvre , B. Multon , Nicolas C. Rouger
Techniques de l’Ingénieur. Energies, 2018, d3232v2, pp.D3232-v2. ⟨10.51257/a-v2-d3232⟩
Journal articles hal-03800328v1

Banc de cyclage actif pour l'analyse de la fatigue thermique des brasures de composants IGBTs

Laurent Dupont , Stéphane Lefebvre , Zoubir Khatir , Gérard Coquery , Jean-Claude Faugiere
La Revue de l'électricité et de l'électronique, 2004, 2, pp.45-51
Journal articles hal-00861641v1

Détection et Diagnostic de défauts dans un convertisseur statique

Mohamed Benbouzid , Claude Delpha , Zoubir Khatir , S. Lefebvre , Demba Diallo
Trigeassou J.C. Diagnostic des Machines Electriques, Hermès / Lavoisier, pp.317-371, 2011
Book sections hal-00617349v1
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Étude du comportement thermique d'un composant GaN de puissance

Cyrille Gautier , Lionel Hoffmann , Francois Costa , Stéphane Lefebvre
Symposium de Génie Électrique 2014, Jul 2014, Cachan, France
Conference papers hal-01065191v1
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Estimation des pertes dans les transistors bipolaires SiC

Cheng Chen , Denis Labrousse , Stéphane Lefebvre , Cyril Buttay , Hervé Morel
Symposium de Génie Electrique (SGE'14), Jul 2014, Cachan, France
Conference papers hal-01065220v1
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Are food web structures well represented in isotopic spaces?

Franck Jabot , C. Giraldo , S. Lefebvre , S. Dubois
Functional Ecology, 2017, 31 (10), pp.1975-1984. ⟨10.1111/1365-2435.12895⟩
Journal articles hal-02607115v1
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New Definition of Critical Energy for SiC MOSFET Robustness under Short- Circuit Operations: the Repetitive Critical Energy

C. Chen , Tien-Anh A Nguyen , D Labrousse , S Lefebvre , Cyril Buttay , et al.
Microelectronics Reliability, 2020, 114, pp.113839. ⟨10.1016/j.microrel.2020.113839⟩
Journal articles hal-02968998v1
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AGING INVESTIGATION OF INVERTER-FED LOW VOLTAGE MOTOR WINDING INSULATION SUBJECTED TO HIGH DV/DT

Veronika Bolgova , Andrey Leonov , Stéphane Lefebvre , S Hlioui
XXVème Symposium sur les phénomènes électromagnétiques dans les circuits non linéaires (EPNC 2018), Jun 2018, Arras, France
Conference papers hal-02363181v1
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SiC MOSFETs robustness for diode-less applications

Oriol Aviño Salvado , C. Cheng , Cyril Buttay , Hervé Morel , D Labrousse , et al.
EPE Journal - European Power Electronics and Drives, 2018, pp.1 - 8. ⟨10.1080/09398368.2018.1456836⟩
Journal articles hal-01844980v1

A study of the effect of degradation of the aluminium metallization layer in the case of power semiconductor devices

S. Pietranico , S. Lefebvre , S. Pommier , M. Berkani Bouaroudj , Sylvain Bontemps
Microelectronics Reliability, 2011, 51 (9-11), pp.1824 - 1829. ⟨10.1016/j.microrel.2011.06.009⟩
Journal articles istex hal-01636559v1

Failure modes on low voltage power MOSFETs under high temperature application

Laurent Dupont , Stéphane Lefebvre , Mounira Bouarroudj , Zoubir Khatir , Jean-Claude Faugieres
Microelectronics Reliability, 2007, 47 (9), p1767-1772. ⟨10.1016/j.microrel.2007.07.066⟩
Journal articles istex hal-01704346v1
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In-depth investigation of metallization aging in power MOSFETs

Roberta Ruffilli , M Berkani , P Dupuy , Stéphane Lefebvre , Y Weber , et al.
Microelectronics Reliability, 2015, Proceedings of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, SI:Proceedings of ESREF 2015, 55 (9-10), pp.1966-1970. ⟨10.1016/j.microrel.2015.06.036⟩
Journal articles hal-01700466v2

S3-Slicer: A General Slicing Framework for Multi-Axis 3D Printing

Tianyu Zhang , Guoxin Fang , Yuming Huang , Neelotpal Dutta , Sylvain Lefebvre , et al.
ACM Transactions on Graphics, 2022, 41 (6), pp.1-15. ⟨10.1145/3550454.3555516⟩
Journal articles hal-03971065v1
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Closed space-filling curves with controlled orientation for 3D printing

Adrien Bedel , Yoann Coudert-Osmont , Jonàs Martínez , Rahnuma Islam Nishat , Sue Whitesides , et al.
Computer Graphics Forum, In press, ⟨10.1111/cgf.14488⟩
Journal articles hal-03185200v2
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Procedural bridges-and-pillars support generation

Marco Freire , Samuel Hornus , Salim Perchy , Sylvain Lefebvre
Eurographics 2022 - 43rd annual conference of the european association for computer graphics, Apr 2022, Reims, France
Conference papers hal-03700018v1
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Influence des modèles de vieillissement sur les impacts environnementaux pour les composants d'électronique de puissance

Briac Baudais , H. Ben Ahmed , Gurvan Jodin , Nicolas Degrenne , Stéphane Lefebvre
SYMPOSIUM DE GENIE ELECTRIQUE (SGE 2023), Jul 2023, Lille, France
Conference papers hal-04189193v1
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Ceilometer inversion method using water-vapor correction from co-located microwave radiometer for aerosol retrievals

Andres E. Bedoya-Velásquez , Marcos Herreras-Giralda , Roberto Román , Matthias Wiegner , Sidonie Lefebvre , et al.
Atmospheric Research, 2021, 250, pp.105379. ⟨10.1016/j.atmosres.2020.105379⟩
Journal articles hal-02865809v2
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Efficient Direct Slicing Of Dilated And Eroded 3d Models For Additive Manufacturing: Technical Report

Sylvain Lefebvre
[Research Report] Inria Nancy - Grand Est. 2019
Reports hal-02360401v1

Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET

B. Tala-Ighil , J.-L. Trolet , H. Gualous , P. Mary , S. Lefebvre
Microelectronics Reliability, 2015, 55 (9-10), pp.1512 - 1516. ⟨10.1016/j.microrel.2015.06.136⟩
Journal articles hal-01700447v1