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Morphological characterization of compact aggregates using image analysis and a geometrical stochastic 3D model

Antoine Bottenmuller , Léo Théodon , Johan Debayle , Christine Frances , Yann Gavet , et al.
ICPRS 13th International Conference on Pattern Recognition Systems, espol - Escuela superior Politécnica del Litoral, Jul 2023, Guayaquil, Ecuador. pp.1 à 7, ⟨10.1109/ICPRS58416.2023.10179036⟩
Conference papers emse-04169754v1