Use of Fourier transfoim in grazing X-rays reflectometry
Résumé
Grazing X-ray reflectometry allows the analysis of thin layer stacks. The fitting of the reflectivity curve by a trial and error method can be used in order to determine the parameters of the films. Fourier analysis of the experimental reflectivity can directly give a rough determination of the profil index. Application to real examples shows the validity of the method.
Origine : Accord explicite pour ce dépôt