THICKNESS DEPENDENCE OF CATHODOLUMINESCENCE IN THIN FILMS - Archive ouverte HAL
Article Dans Une Revue Journal de Physique Colloques Année : 1989

THICKNESS DEPENDENCE OF CATHODOLUMINESCENCE IN THIN FILMS

J. Yuan
  • Fonction : Auteur
Sébastien Berger
L. Brown
  • Fonction : Auteur

Résumé

Thin film samples have been increasingly used in high resolution imaging studies of cathodoluminescence (CL) from materials, in order to achieve the smallest CL source possible[1–3]. The analysis of the luminescence signals from thin film material is often hampered by the changes associated with the film thickness variation. This thickness effect has been analysed in a simple model which takes into account the diffusion of the excited states in thin films. The electron beam is assumed to provide a uniform excitation density over the entire film thickness appropriate to electron transparent films (the definition of which is also given). The intensity variation of CL signal as a function the foil thickness t is given by the formula I(t) =I0(t–(2L)/(coth(t/2L)+f) where L is the diffusion length of the energy carrier in a bulk sample ; f is the ratio of the bulk diffusion 'velocity' L/τ to that of the surface diffusion velocity s. Both physical parameters can be obtained from a plot of the CL intensity verses the film thickness. This has been applied to a number of materials such as Y2O3 : Eu3+, YAG : Ce3+, Diamond and InP. For the last two types of materials, the result of the analysis is consistent with those from other experiments[3, 4]. For phosphors with a relatively large doping of luminescent ions, the saturation effect caused by an intense excitation density must be taken into account in interpreting the physical parameters deduced[5, 6].

Domaines

Articles anciens
Fichier principal
Vignette du fichier
ajp-jphyscol198950C631.pdf (38.63 Ko) Télécharger le fichier
Origine Accord explicite pour ce dépôt

Dates et versions

jpa-00229662 , version 1 (04-02-2008)

Identifiants

Citer

J. Yuan, Sébastien Berger, L. Brown. THICKNESS DEPENDENCE OF CATHODOLUMINESCENCE IN THIN FILMS. Journal de Physique Colloques, 1989, 50 (C6), pp.C6-177-C6-177. ⟨10.1051/jphyscol:1989631⟩. ⟨jpa-00229662⟩

Collections

AJP
28 Consultations
72 Téléchargements

Altmetric

Partager

More