CAPTURE CROSS-SECTIONS OF DEEP LEVELS IN SUPERLATTICES
Résumé
Transient capacitance spectroscopy can be used to characterize superlattices and the defects they contain. Here, we describe the measurement of electron capture cross-sections of deep levels introduced by electron irradiation. The variation of the capture rate versus temperature indicates that this capture occurs through a multiphonon emission process whose characteristics can be predicted in taking into account the superlattice band structure.
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Articles anciens
Origine : Accord explicite pour ce dépôt
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