Contribution to metrological corrections of a high spectral resolution mid infrared spectral imager
Résumé
Mid-infrared spectral imaging is becoming increasingly attractive in various fields, from polymer analysis to vegetation monitoring. While conventional architectures such as push-broom systems are now commercially available, applications demanding high spectral resolution or tunability increasingly rely on laser-based illumination.However, coherent sources introduce metrological challenges, including speckle artifacts, intensity instabilities, and beam pointing fluctuations. This work presents correction strategies addressing these effects in a tunable laser imaging system with 10 nm spectral resolution, enabling accurate and reliable data acquisition