European Test Symposium Teams : an Anniversary Snapshot
2 Technical University of Cluj-Napoca
3 ESLAB - Embedded Systems Laboratory [Linköping Univ]
4 AGRA - Group of Computer Architecture
5 Siemens EDA, Tessent
6 TUHH - Institute of Embedded Systems [Hamburg University of Technology]
7 ESAT-MICAS - ESAT-MICAS
8 ONSEMI - ON Semiconductor Technology
9 imec - Interuniversity Microelectronics Centre
10 TIMA-AMfoRS - Architectures and Methods for Resilient Systems
11 TIMA-RMS - Reliable RF and Mixed-signal Systems
12 Polito - Politecnico di Torino = Polytechnic of Turin
13 CIAN - Circuits Intégrés Numériques et Analogiques
14 Department of Electrical and Computer Engineering [Cyprus]
15 ECL - École Centrale de Lyon
16 IETR - Institut d'Électronique et des Technologies du numéRique
17 LIRMM | TEST - Test and dEpendability of microelectronic integrated SysTems
18 TARAN - Architectures matérielles spécialisées pour l’ère post loi-de-Moore
19 IUF - Institut universitaire de France
20 UNITN - Università degli Studi di Trento = University of Trento
21 IHP - Innovations for High Performance Microelectronics
22 University of Potsdam = Universität Potsdam
23 Synopsys Armenia
24 SMU - Southern Methodist University [Dallas, TX, USA]
25 University of St. Thomas
26 TU Delft - Delft University of Technology
27 Georgia Institute of Technology [Atlanta]
28 Intel Corporation [Hillsboro]
29 Rebellions AI
30 Google Inc [Mountain View]
31 KIT - Department of Informatics [Karlsruhe Institute of Technology]
32 ECE - School of Electrical Engineering and Computer Science [Tehran]
33 University of Stuttgart = Universität Stuttgart
34 University of Paderborn
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- IdHAL : salvador-mir
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- IdHAL : alberto-bosio
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Résumé
The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team’s section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.
| Origine | Fichiers produits par l'(les) auteur(s) |
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