Communication Dans Un Congrès Année : 2023

µLaue diffraction and XEOL to study structure and light emission in materials

Résumé

The emergence of disruptive functionalities in nitrides is strongly related to the growth and technology process controls, but also to the development of advanced characterization techniques with high spatial resolutions. Focused X-ray beams provide innovative solutions to analyze quantitatively and correlatively the strain and light emission by combining µLaue diffraction (µLaue) and X-ray excited optical luminescence (XEOL), the two signals being recorded for the same time during mappings. We will illustrate in this communication some recent experimental and analysis breakthroughs obtained at the BM32 beamline of the European Synchrotron Radiation Facility.

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Dates et versions

hal-05007823 , version 1 (27-03-2025)

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  • HAL Id : hal-05007823 , version 1

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J. Eymery, Ravi Raj Purohit Purushottam Raj Purohit, Alexis Eymery, Odile Robach, Jean-Sébastien Micha, et al.. µLaue diffraction and XEOL to study structure and light emission in materials. ICCGE20 - The International Conference on Crystal Growth and Epitaxy, Jul 2023, Naples, Italy. ⟨hal-05007823⟩
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