µLaue diffraction and XEOL to study structure and light emission in materials
Résumé
The emergence of disruptive functionalities in nitrides is strongly related to the growth and technology process controls, but also to the development of advanced characterization techniques with high spatial resolutions. Focused X-ray beams provide innovative solutions to analyze quantitatively and correlatively the strain and light emission by combining µLaue diffraction (µLaue) and X-ray excited optical luminescence (XEOL), the two signals being recorded for the same time during mappings. We will illustrate in this communication some recent experimental and analysis breakthroughs obtained at the BM32 beamline of the European Synchrotron Radiation Facility.
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