Frequency Model Investigation for ESD failure prediction
Résumé
Dynamic model of ESD protection devices presents many advantages to simulate the response of these components when they are submitted to very high-level transient pulses such as EMP (electro-magnetic pulses) residual. Dynamic models extracted from frequency measurements will be used to demonstrate how such measurement can provide a complete dynamic model (including fast response and thermal effect of ESD device protection). Doing so, a topology composed of a capacitor in parallel to a snapback protection will be studied in order to decide whether or not it is interesting to used dynamic model obtained from frequency measurement over usual quasi-static model to predict a component failure.
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