Preprints, Working Papers, ... Year : 2025

Reflection to improve ESD protection simulation based on voltage-dependent dynamic model

Abstract

Dynamic model of ESD protection devices presents many advantages to simulate the response of these components when they are submitted to very high-level transient impulsions such as EMP residue. However, a major issue with these models is that they are defined for a specific operating point and in many cases the operating point of components can change during EMP event. In this article, a way to improve dynamic simulation by building voltage dependent RLC equivalent models will be explored to overcome this limitation and simulate complex circuit such as a snapback TVS in parallel to a capacitor.

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Dates and versions

hal-04978913 , version 1 (05-03-2025)

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  • HAL Id : hal-04978913 , version 1

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Fabrice Caignet, François Ruffat, Kemystetter Lucas, Alexandre Boyer, Guillaume Mejecaze, et al.. Reflection to improve ESD protection simulation based on voltage-dependent dynamic model. 2025. ⟨hal-04978913⟩
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