Reflection to improve ESD protection simulation based on voltage-dependent dynamic model
Abstract
Dynamic model of ESD protection devices presents many advantages to simulate the response of these components when they are submitted to very high-level transient impulsions such as EMP residue. However, a major issue with these models is that they are defined for a specific operating point and in many cases the operating point of components can change during EMP event. In this article, a way to improve dynamic simulation by building voltage dependent RLC equivalent models will be explored to overcome this limitation and simulate complex circuit such as a snapback TVS in parallel to a capacitor.
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