Communication Dans Un Congrès Année : 2013

Double-scale study of cellular materials by X-ray tomography and finite element modeling

Résumé

Cellular materials are multifonctionnal materials, which can be used in various applications. The study of their microstructure has to be performed at different scales. The mesostructure describes the architecture of the material: distribution of solid phase and voids, relative density, distribution of pores size and cells size, etc. Numerous studies have been performed about the link between these parameters and the mechanical properties. For this purpose, X-ray tomography is often used because it can provide useful information about the architecture of the foam. But, the microstructure of the material of which the foam is made is also important. The microstructural characteristics (presence of micropores in the struts or impurities in the material) can have a strong influence on the macroscopic properties. High resolution observations can be done thanks to the so called ‘local tomography’ version of the technique, in which the sample is placed close to the X-ray source. It is then larger than the field of view but reconstructions can still be achieved, although a little bit noisier. High resolution images obtained with local tomography can thus be combined with lower resolution ones. Therefore, tomography enables to perform studies of the cellular materials at two scales. In-situ mechanical tests can be done in the tomograph. Consequently, thanks to all these tomographic images, the mechanical behaviour of the cellular material can be explained according to two scales. Moreover, the information obtained by high resolution images can be transferred into the finite element simulation performed at low resolution. In this presentation, we will show examples of cellular materials where we have created a "dialog" between the two scales in order to explain the macroscopic behaviour from the knowledge of the microstructure.

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Dates et versions

hal-04956316 , version 1 (19-02-2025)

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  • HAL Id : hal-04956316 , version 1

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Clémence Petit, E Maire, Sylvain Meille. Double-scale study of cellular materials by X-ray tomography and finite element modeling. 1st International Workshop on Security Science and Engineering of Advanced Energy System - INSA Lyon Tohoku University Mini Workshop, Feb 2013, Lyon, France. ⟨hal-04956316⟩
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