Poster De Conférence Année : 2008

Evaluation of self-shunted NbN/TaN/NbN Josephson junctions for digital electronics

Résumé

Intrinsically shunted Josephson junctions based on NbN superconducting material can exhibit RnIc products in the1-3 mV range at temperatures in the 4-10K range, while presenting non hysteretic current-voltage characteristics. For these reasons, they are a suitable alternative for digital electronics since they can be ultimately highly integrated, while operating at clock frequencies above 100 GHz. In this work, departing from some experimental data of Josephson junctions measured in different conditions, we will present the expected performances in terms of ultimate speed, bit-error-rate and temperature of operation that can be reached with such a technology, for a few breadboard digital circuits. Circuits using interface converters, Josephson transmission lines, shift registers and several flip-flop cells are investigated for this purpose. An analysis is done in order to compare the potentialities and drawbacks of this technology with its existing low-Tc and high-Tc counterparts. The emphasis will be put on the technological requirements that are necessary to be met in order to achieve a given performance.

Fichier principal
Vignette du fichier
Febvre-self-shunted-NbN-ASC2008.pdf (685.79 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Licence

Dates et versions

hal-04929387 , version 1 (04-02-2025)

Licence

Identifiants

  • HAL Id : hal-04929387 , version 1

Citer

Pascal Febvre, Vratislav Michal, Romano Setzu, Jean-Claude Villégier. Evaluation of self-shunted NbN/TaN/NbN Josephson junctions for digital electronics. Applied Superconductivity Conference (ASC 2008), Aug 2008, Chicago, United States. ⟨hal-04929387⟩
77 Consultations
46 Téléchargements

Partager

  • More