<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-04898513</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-22T06:28:23+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Mutual inductance critical current measurements in oxygen-deficient YBa2Cu3O7-δ thin films</title>
            <author role="aut">
              <persName>
                <forename type="first">M.</forename>
                <surname>Stenger</surname>
              </persName>
              <idno type="halauthorid">3377805-0</idno>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">C.</forename>
                <surname>Barre</surname>
              </persName>
              <idno type="halauthorid">286978-0</idno>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">J.</forename>
                <surname>Joffrin</surname>
              </persName>
              <idno type="halauthorid">256224-0</idno>
              <affiliation ref="#struct-134"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">J.-Y.</forename>
                <surname>Prieur</surname>
              </persName>
              <idno type="halauthorid">258262-0</idno>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">R.</forename>
                <surname>Wördenweber</surname>
              </persName>
              <idno type="halauthorid">298555-0</idno>
            </author>
            <editor role="depositor">
              <persName>
                <forename>LPS</forename>
                <surname>Gestionnaire</surname>
              </persName>
              <email type="md5">892da8601da6d870e24ca8bf3ab08ad4</email>
              <email type="domain">u-psud.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2025-01-20 10:44:09</date>
              <date type="whenModified">2025-01-22 03:18:58</date>
              <date type="whenReleased">2025-01-20 10:44:09</date>
              <date type="whenProduced">1996</date>
              <ref type="externalLink" target="https://api.istex.fr/ark:/67375/1BB-XHF7QWH3-4/fulltext.pdf?sid=hal"/>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="1048593">
                <persName>
                  <forename>LPS</forename>
                  <surname>Gestionnaire</surname>
                </persName>
                <email type="md5">892da8601da6d870e24ca8bf3ab08ad4</email>
                <email type="domain">u-psud.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-04898513</idno>
            <idno type="halUri">https://hal.science/hal-04898513</idno>
            <idno type="halBibtex">stenger:hal-04898513</idno>
            <idno type="halRefHtml">&lt;i&gt;Journal of Low Temperature Physics&lt;/i&gt;, 1996, 105 (5-6), pp.1313-1318. &lt;a target="_blank" href="https://dx.doi.org/10.1007/BF00753882"&gt;&amp;#x27E8;10.1007/BF00753882&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">Journal of Low Temperature Physics, 1996, 105 (5-6), pp.1313-1318. &amp;#x27E8;10.1007/BF00753882&amp;#x27E9;</idno>
            <availability status="restricted"/>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno>
            <idno type="stamp" n="UNIV-PSUD">Université Paris Sud - Paris XI</idno>
            <idno type="stamp" n="UNIV-PARIS-SACLAY">Université Paris-Saclay</idno>
            <idno type="stamp" n="UNIV-PSUD-SACLAY" corresp="UNIV-PARIS-SACLAY">Université Paris Sud pour Paris Saclay</idno>
            <idno type="stamp" n="GS-PHYSIQUE">Graduate School Physique</idno>
            <idno type="stamp" n="LPSO">Laboratoire de Physique des Solides d'Orsay</idno>
            <idno type="stamp" n="URP-LPS">Laboratoire de Psychologie Sociale : contextes et régulation</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Mutual inductance critical current measurements in oxygen-deficient YBa2Cu3O7-δ thin films</title>
                <author role="aut">
                  <persName>
                    <forename type="first">M.</forename>
                    <surname>Stenger</surname>
                  </persName>
                  <idno type="halauthorid">3377805-0</idno>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">C.</forename>
                    <surname>Barre</surname>
                  </persName>
                  <idno type="halauthorid">286978-0</idno>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">J.</forename>
                    <surname>Joffrin</surname>
                  </persName>
                  <idno type="halauthorid">256224-0</idno>
                  <affiliation ref="#struct-134"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">J.-Y.</forename>
                    <surname>Prieur</surname>
                  </persName>
                  <idno type="halauthorid">258262-0</idno>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">R.</forename>
                    <surname>Wördenweber</surname>
                  </persName>
                  <idno type="halauthorid">298555-0</idno>
                </author>
              </analytic>
              <monogr>
                <idno type="halJournalId" status="VALID">15709</idno>
                <idno type="issn">0022-2291</idno>
                <idno type="eissn">1573-7357</idno>
                <title level="j">Journal of Low Temperature Physics</title>
                <imprint>
                  <publisher>Springer Verlag (Germany)</publisher>
                  <biblScope unit="volume">105</biblScope>
                  <biblScope unit="issue">5-6</biblScope>
                  <biblScope unit="pp">1313-1318</biblScope>
                  <date type="datePub">1996</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1007/BF00753882</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">Thermal effects</term>
                <term xml:lang="en">Yttrium compounds</term>
                <term xml:lang="en">Contactless mutual inductance method</term>
                <term xml:lang="en">Oxygen deficiency</term>
                <term xml:lang="en">Yttrium barium copper oxide</term>
                <term xml:lang="en">Superconducting films</term>
                <term xml:lang="en">Oxygen</term>
                <term xml:lang="en">Oxide superconductors</term>
                <term xml:lang="en">High temperature superconductors</term>
                <term xml:lang="en">Electric current measurement</term>
                <term xml:lang="en">Critical currents</term>
                <term xml:lang="en">Critical current density (superconductivity)</term>
                <term xml:lang="en">Composition effects</term>
              </keywords>
              <classCode scheme="halDomain" n="phys.cond">Physics [physics]/Condensed Matter [cond-mat]</classCode>
              <classCode scheme="halTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halOldTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halTreeTypology" n="ART">Journal articles</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>Comparative studies of a standard four-contact DC method and a contactless mutual inductance setup have been carried out on the temperature dependence of the critical current of YBa2Cu3O7-δ (YBCO) thin films. The DC measurements are restricted to low currents due to contact heating, whereas the mutual inductance method works well at higher currents. The temperature dependence of the values obtained by the two methods agrees fairly well in the temperature window accessible by both of them. Hence the DC values can be used to calibrate the mutual inductance ones. Thus, the critical current can be determined in a larger temperature range as compared to simple DC measurements. We have applied both techniques to two films with oxygen deficiencies δ of 0.08 and 0.31. The obtained calibration factor allowed us to determine the critical current density of a third sample with δ=0.24 inductively. The critical current density drops dramatically with the oxygen content. At T/Tc=0.80, the critical current of the film with δ=0.08 is more than 40 times larger than that of the film with δ=0.31.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-134" status="OLD">
          <orgName>Laboratoire de Physique des Solides</orgName>
          <orgName type="acronym">LPS</orgName>
          <date type="end">2019-12-31</date>
          <desc>
            <address>
              <addrLine>Bat. 510 91405 Orsay cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.lps.u-psud.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-92966" type="direct"/>
            <relation name="UMR8502" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-92966" status="OLD">
          <idno type="ROR">https://ror.org/028rypz17</idno>
          <orgName>Université Paris-Sud - Paris 11</orgName>
          <orgName type="acronym">UP11</orgName>
          <date type="end">2019-12-31</date>
          <desc>
            <address>
              <addrLine>Bâtiment 300 - 91405 Orsay cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.u-psud.fr/</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-441569" status="VALID">
          <idno type="IdRef">02636817X</idno>
          <idno type="ISNI">0000000122597504</idno>
          <idno type="ROR">https://ror.org/02feahw73</idno>
          <orgName>Centre National de la Recherche Scientifique</orgName>
          <orgName type="acronym">CNRS</orgName>
          <date type="start">1939-10-19</date>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.cnrs.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>