<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-04898060</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-21T18:44:06+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Structural characterization of epitaxial Cu2Mo6S8 thin films grown on R-cut sapphire by pulsed laser deposition</title>
            <author role="aut">
              <persName>
                <forename type="first">N.</forename>
                <surname>Lemée</surname>
              </persName>
              <email type="md5">170264522594073030dd094fc09281ab</email>
              <email type="domain">u-picardie.fr</email>
              <idno type="idhal" notation="numeric">1154836</idno>
              <idno type="halauthorid" notation="string">2379935-1154836</idno>
              <idno type="ORCID">https://orcid.org/0000-0003-0958-7701</idno>
              <idno type="IDREF">https://www.idref.fr/170505073</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/AAC-2193-2019</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/AAC-2193-2019</idno>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">M.</forename>
                <surname>Guilloux-Viry</surname>
              </persName>
              <email type="md5">c27594f085ea6f5f718b2f872bcf07a3</email>
              <email type="domain">univ-rennes1.fr</email>
              <idno type="idhal" notation="numeric">848832</idno>
              <idno type="halauthorid" notation="string">1724145-848832</idno>
              <idno type="ORCID">https://orcid.org/0000-0001-7773-1643</idno>
              <idno type="IDREF">https://www.idref.fr/069135843</idno>
              <idno type="VIAF">https://viaf.org/viaf/203867732</idno>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">A.</forename>
                <surname>Perrin</surname>
              </persName>
              <idno type="halauthorid">66030-0</idno>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">M.</forename>
                <surname>Kugler</surname>
              </persName>
              <idno type="halauthorid">274615-0</idno>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Ø.</forename>
                <surname>Fischer</surname>
              </persName>
              <idno type="halauthorid">266135-0</idno>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Z.Z.</forename>
                <surname>Li</surname>
              </persName>
              <idno type="halauthorid">289093-0</idno>
              <affiliation ref="#struct-134"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">H.</forename>
                <surname>Raffy</surname>
              </persName>
              <idno type="halauthorid">66658-0</idno>
              <affiliation ref="#struct-134"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>LPS</forename>
                <surname>Gestionnaire</surname>
              </persName>
              <email type="md5">892da8601da6d870e24ca8bf3ab08ad4</email>
              <email type="domain">u-psud.fr</email>
            </editor>
            <funder>French Ministry of Research and Technology</funder>
            <funder>Fondation Langlois</funder>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2025-01-20 10:32:29</date>
              <date type="whenModified">2025-02-17 14:51:55</date>
              <date type="whenReleased">2025-01-20 10:32:29</date>
              <date type="whenProduced">1999</date>
              <ref type="externalLink" target="https://api.istex.fr/ark:/67375/6H6-QFCRXLDZ-6/fulltext.pdf?sid=hal"/>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="1048593">
                <persName>
                  <forename>LPS</forename>
                  <surname>Gestionnaire</surname>
                </persName>
                <email type="md5">892da8601da6d870e24ca8bf3ab08ad4</email>
                <email type="domain">u-psud.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-04898060</idno>
            <idno type="halUri">https://hal.science/hal-04898060</idno>
            <idno type="halBibtex">lemee:hal-04898060</idno>
            <idno type="halRefHtml">&lt;i&gt;Thin Solid Films&lt;/i&gt;, 1999, 353 (1), pp.62-66. &lt;a target="_blank" href="https://dx.doi.org/10.1016/S0040-6090(99)00393-4"&gt;&amp;#x27E8;10.1016/S0040-6090(99)00393-4&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">Thin Solid Films, 1999, 353 (1), pp.62-66. &amp;#x27E8;10.1016/S0040-6090(99)00393-4&amp;#x27E9;</idno>
            <availability status="restricted"/>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno>
            <idno type="stamp" n="UNIV-PSUD">Université Paris Sud - Paris XI</idno>
            <idno type="stamp" n="UNIV-PARIS-SACLAY">Université Paris-Saclay</idno>
            <idno type="stamp" n="UNIV-PSUD-SACLAY" corresp="UNIV-PARIS-SACLAY">Université Paris Sud pour Paris Saclay</idno>
            <idno type="stamp" n="GS-PHYSIQUE">Graduate School Physique</idno>
            <idno type="stamp" n="LPSO">Laboratoire de Physique des Solides d'Orsay</idno>
            <idno type="stamp" n="URP-LPS">Laboratoire de Psychologie Sociale : contextes et régulation</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Structural characterization of epitaxial Cu2Mo6S8 thin films grown on R-cut sapphire by pulsed laser deposition</title>
                <author role="aut">
                  <persName>
                    <forename type="first">N.</forename>
                    <surname>Lemée</surname>
                  </persName>
                  <email type="md5">170264522594073030dd094fc09281ab</email>
                  <email type="domain">u-picardie.fr</email>
                  <idno type="idhal" notation="numeric">1154836</idno>
                  <idno type="halauthorid" notation="string">2379935-1154836</idno>
                  <idno type="ORCID">https://orcid.org/0000-0003-0958-7701</idno>
                  <idno type="IDREF">https://www.idref.fr/170505073</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/AAC-2193-2019</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/AAC-2193-2019</idno>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">M.</forename>
                    <surname>Guilloux-Viry</surname>
                  </persName>
                  <email type="md5">c27594f085ea6f5f718b2f872bcf07a3</email>
                  <email type="domain">univ-rennes1.fr</email>
                  <idno type="idhal" notation="numeric">848832</idno>
                  <idno type="halauthorid" notation="string">1724145-848832</idno>
                  <idno type="ORCID">https://orcid.org/0000-0001-7773-1643</idno>
                  <idno type="IDREF">https://www.idref.fr/069135843</idno>
                  <idno type="VIAF">https://viaf.org/viaf/203867732</idno>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">A.</forename>
                    <surname>Perrin</surname>
                  </persName>
                  <idno type="halauthorid">66030-0</idno>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">M.</forename>
                    <surname>Kugler</surname>
                  </persName>
                  <idno type="halauthorid">274615-0</idno>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Ø.</forename>
                    <surname>Fischer</surname>
                  </persName>
                  <idno type="halauthorid">266135-0</idno>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Z.Z.</forename>
                    <surname>Li</surname>
                  </persName>
                  <idno type="halauthorid">289093-0</idno>
                  <affiliation ref="#struct-134"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">H.</forename>
                    <surname>Raffy</surname>
                  </persName>
                  <idno type="halauthorid">66658-0</idno>
                  <affiliation ref="#struct-134"/>
                </author>
              </analytic>
              <monogr>
                <idno type="halJournalId" status="VALID">19622</idno>
                <idno type="issn">0040-6090</idno>
                <title level="j">Thin Solid Films</title>
                <imprint>
                  <publisher>Elsevier</publisher>
                  <biblScope unit="volume">353</biblScope>
                  <biblScope unit="issue">1</biblScope>
                  <biblScope unit="pp">62-66</biblScope>
                  <date type="datePub">1999</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1016/S0040-6090(99)00393-4</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">Scanning tunneling microscopy</term>
                <term xml:lang="en">Copper compounds</term>
                <term xml:lang="en">Deposition</term>
                <term xml:lang="en">Epitaxial growth</term>
                <term xml:lang="en">Laser ablation</term>
                <term xml:lang="en">Reflection high energy electron diffraction</term>
                <term xml:lang="en">Scanning electron microscopy</term>
                <term xml:lang="en">Substrates</term>
                <term xml:lang="en">Thin films</term>
                <term xml:lang="en">Pulsed laser deposition</term>
                <term xml:lang="en">Field emission high resolution scanning electron microscopy</term>
                <term xml:lang="en">Copper molybdenum sulfides</term>
                <term xml:lang="en">X ray diffraction analysis</term>
                <term xml:lang="en">Tunnel junctions</term>
                <term xml:lang="en">Surface structure</term>
              </keywords>
              <classCode scheme="halDomain" n="phys.cond">Physics [physics]/Condensed Matter [cond-mat]</classCode>
              <classCode scheme="halTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halOldTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halTreeTypology" n="ART">Journal articles</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>We report the successful growth of Cu2Mo6S8 thin films. They were grown in situ by pulsed laser deposition (PLD) on R-cut sapphire substrates. Both X-ray (XRD) and high energy electron diffraction (RHEED) showed a high degree of epitaxial growth and θ-2θ XRD analysis pointed out a (001)R orientation (in the rhombohedral setting). XRD φ-scans showed the coexistence of two rhombohedral families rotated by 180°, with the epitaxial relations: [100]film ∥ [1̄11]substrate and [010]film ∥ [1̄11̄]substrate for one family and the reverse for the other. Laue oscillations in the θ-2θ XRD patterns and the narrow rocking curve on the (001)R reflection demonstrate the high crystalline quality, scanning tunneling microscopy (STM) and field emission high resolution scanning electron microscopy (FE-SEM) confirmed the surface smoothness and the in-plane alignment.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-134" status="OLD">
          <orgName>Laboratoire de Physique des Solides</orgName>
          <orgName type="acronym">LPS</orgName>
          <date type="end">2019-12-31</date>
          <desc>
            <address>
              <addrLine>Bat. 510 91405 Orsay cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.lps.u-psud.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-92966" type="direct"/>
            <relation name="UMR8502" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-92966" status="OLD">
          <idno type="ROR">https://ror.org/028rypz17</idno>
          <orgName>Université Paris-Sud - Paris 11</orgName>
          <orgName type="acronym">UP11</orgName>
          <date type="end">2019-12-31</date>
          <desc>
            <address>
              <addrLine>Bâtiment 300 - 91405 Orsay cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.u-psud.fr/</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-441569" status="VALID">
          <idno type="IdRef">02636817X</idno>
          <idno type="ISNI">0000000122597504</idno>
          <idno type="ROR">https://ror.org/02feahw73</idno>
          <orgName>Centre National de la Recherche Scientifique</orgName>
          <orgName type="acronym">CNRS</orgName>
          <date type="start">1939-10-19</date>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.cnrs.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>