Atomic-scale STEM-EELS mapping across functional interfaces
Résumé
Aberration-corrected scanning transmission electron microscopes can now raster Angström-sized electron probes across cross-sectional foils with interfaces parallel to the incident beam. Bright and annular dark field images deliver views of the structural arrangement of the atomic columns across such interfaces. In parallel, electron energy-loss spectroscopy is efficient for recording the electronic response of the specimen with a high level of spatial and energy resolution. It thus provides maps, atomic column by atomic column, of the nature, and in some cases of the bonding state, of the atoms across artificially grown heterolayers for electronics, spintronics, and photonics components.
Mots clés
- Atoms
- Transmission electron microscopy
- Atomic columns
- Atomic scale
- Bonding state
- Dark field images
- Electron probe
- Energy resolutions
- Electron energy loss spectroscopy
- Structural arrangement
- STEM-EELS
- Spintronics
- Scanning transmission electron microscopes
- Incident beams
- Heterolayers
- Functional interface