Article Dans Une Revue Journal of the Minerals Metals & Materials Society (JOM) Année : 2010

Atomic-scale STEM-EELS mapping across functional interfaces

Résumé

Aberration-corrected scanning transmission electron microscopes can now raster Angström-sized electron probes across cross-sectional foils with interfaces parallel to the incident beam. Bright and annular dark field images deliver views of the structural arrangement of the atomic columns across such interfaces. In parallel, electron energy-loss spectroscopy is efficient for recording the electronic response of the specimen with a high level of spatial and energy resolution. It thus provides maps, atomic column by atomic column, of the nature, and in some cases of the bonding state, of the atoms across artificially grown heterolayers for electronics, spintronics, and photonics components.

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Dates et versions

hal-04883354 , version 1 (13-01-2025)

Identifiants

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Christian Colliex, Laura Bocher, Francisco de la Peňa, Alexandre Gloter, Katia March, et al.. Atomic-scale STEM-EELS mapping across functional interfaces. Journal of the Minerals Metals & Materials Society (JOM), 2010, 62 (12), pp.53-57. ⟨10.1007/s11837-010-0181-9⟩. ⟨hal-04883354⟩
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