<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-04879097</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-16T01:20:08+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Quantification of Interfacial Charges in Multilayered Nanocapacitors by Operando Electron Holography</title>
            <author role="aut">
              <persName>
                <forename type="first">Leifeng</forename>
                <surname>Zhang</surname>
              </persName>
              <email type="md5">59e5504393f8ead12813e7281d1c6a0e</email>
              <email type="domain">163.com</email>
              <idno type="idhal" notation="string">leifeng-zhang</idno>
              <idno type="idhal" notation="numeric">1167329</idno>
              <idno type="halauthorid" notation="string">1613340-1167329</idno>
              <idno type="ORCID">https://orcid.org/0000-0002-6023-0532</idno>
              <idno type="IDREF">https://www.idref.fr/24020011X</idno>
              <affiliation ref="#struct-460"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Muhammad</forename>
                <forename type="middle">Hamid</forename>
                <surname>Raza</surname>
              </persName>
              <idno type="halauthorid">3364970-0</idno>
              <affiliation ref="#struct-220689"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Rong</forename>
                <surname>Wu</surname>
              </persName>
              <idno type="halauthorid">696176-0</idno>
              <affiliation ref="#struct-220689"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Kilian</forename>
                <surname>Gruel</surname>
              </persName>
              <idno type="halauthorid">2327018-0</idno>
              <affiliation ref="#struct-460"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Catherine</forename>
                <surname>Dubourdieu</surname>
              </persName>
              <email type="md5">5c98d1117f9b1071dd3eb5c6cb39b045</email>
              <email type="domain">helmholtz-berlin.de</email>
              <idno type="idhal" notation="numeric">1278898</idno>
              <idno type="halauthorid" notation="string">808834-1278898</idno>
              <idno type="ORCID">https://orcid.org/0000-0002-4642-6897</idno>
              <affiliation ref="#struct-220689"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Martin</forename>
                <surname>Hÿtch</surname>
              </persName>
              <email type="md5">28afb1ae02a002a8f624a75a1689b343</email>
              <email type="domain">cemes.fr</email>
              <idno type="idhal" notation="string">martin-hytch</idno>
              <idno type="idhal" notation="numeric">17686</idno>
              <idno type="halauthorid" notation="string">33052-17686</idno>
              <idno type="ORCID">https://orcid.org/0000-0002-9099-0129</idno>
              <idno type="IDREF">https://www.idref.fr/131509829</idno>
              <affiliation ref="#struct-519177"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Christophe</forename>
                <surname>Gatel</surname>
              </persName>
              <email type="md5">29f68dd938c7e2c52d67ab2c52b9d5c2</email>
              <email type="domain">cemes.fr</email>
              <idno type="idhal" notation="string">christophe-gatel</idno>
              <idno type="idhal" notation="numeric">11804</idno>
              <idno type="halauthorid" notation="string">1148-11804</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/F-6046-2014</idno>
              <idno type="ORCID">https://orcid.org/0000-0001-5549-7008</idno>
              <idno type="IDREF">https://www.idref.fr/08954840X</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/F-6046-2014</idno>
              <affiliation ref="#struct-519177"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Leifeng</forename>
                <surname>ZHANG</surname>
              </persName>
              <email type="md5">59e5504393f8ead12813e7281d1c6a0e</email>
              <email type="domain">163.com</email>
            </editor>
            <funder ref="#projanr-102945"/>
            <funder ref="#projanr-53650"/>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2025-01-10 11:33:33</date>
              <date type="whenModified">2025-10-22 18:04:09</date>
              <date type="whenReleased">2025-01-10 15:30:31</date>
              <date type="whenProduced">2024-11-25</date>
              <date type="whenEndEmbargoed">2025-01-10</date>
              <ref type="file" target="https://hal.science/hal-04879097v1/document">
                <date notBefore="2025-01-10"/>
              </ref>
              <ref type="file" subtype="greenPublisher" n="1" target="https://hal.science/hal-04879097v1/file/%5B3%5D%202024%20-%20Leifeng%20Zhang%20-%20Advanced%20Materials%20-%20Quantification%20of%20Interfacial%20Charges%20in%20Multilayered%20Nanocapacitors%20by%20Operando%20Eectron%20Holography.pdf" id="file-4879097-4242408">
                <date notBefore="2025-01-10"/>
              </ref>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="689342">
                <persName>
                  <forename>Leifeng</forename>
                  <surname>ZHANG</surname>
                </persName>
                <email type="md5">59e5504393f8ead12813e7281d1c6a0e</email>
                <email type="domain">163.com</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-04879097</idno>
            <idno type="halUri">https://hal.science/hal-04879097</idno>
            <idno type="halBibtex">zhang:hal-04879097</idno>
            <idno type="halRefHtml">&lt;i&gt;Advanced Materials&lt;/i&gt;, 2024, &lt;a target="_blank" href="https://dx.doi.org/10.1002/adma.202413691"&gt;&amp;#x27E8;10.1002/adma.202413691&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">Advanced Materials, 2024, &amp;#x27E8;10.1002/adma.202413691&amp;#x27E9;</idno>
            <availability status="restricted">
              <licence target="https://creativecommons.org/licenses/by-nc/4.0/">CC BY-NC 4.0 - Attribution - Non-commercial use<ref corresp="#file-4879097-4242408"/></licence>
            </availability>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="IRD">IRD - Institut de recherche pour le développement</idno>
            <idno type="stamp" n="UNIV-TLSE3">Université de Toulouse</idno>
            <idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno>
            <idno type="stamp" n="INSA-TOULOUSE">Institut National des Sciences Appliquées de Toulouse</idno>
            <idno type="stamp" n="INC-CNRS">Institut de Chimie du CNRS</idno>
            <idno type="stamp" n="CEMES">Centre d'élaboration de matériaux et d'études structurales</idno>
            <idno type="stamp" n="I3EM" corresp="CEMES">Interférometrie In-situ, Instrumentation pour la Microscopie Electronique</idno>
            <idno type="stamp" n="INSA-GROUPE">Groupe INSA</idno>
            <idno type="stamp" n="ANR">ANR</idno>
            <idno type="stamp" n="FERMI" corresp="CNRS">Fédération de recherche « Matière et interactions »</idno>
            <idno type="stamp" n="TOULOUSE-INP">Toulouse - INP</idno>
            <idno type="stamp" n="UNIV-UT3">Université Toulouse 3</idno>
            <idno type="stamp" n="UT3-INP">Université de Toulouse / Toulouse INP</idno>
            <idno type="stamp" n="UT3-TOULOUSEINP">Université de Toulouse / Toulouse INP</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Quantification of Interfacial Charges in Multilayered Nanocapacitors by Operando Electron Holography</title>
                <author role="aut">
                  <persName>
                    <forename type="first">Leifeng</forename>
                    <surname>Zhang</surname>
                  </persName>
                  <email type="md5">59e5504393f8ead12813e7281d1c6a0e</email>
                  <email type="domain">163.com</email>
                  <idno type="idhal" notation="string">leifeng-zhang</idno>
                  <idno type="idhal" notation="numeric">1167329</idno>
                  <idno type="halauthorid" notation="string">1613340-1167329</idno>
                  <idno type="ORCID">https://orcid.org/0000-0002-6023-0532</idno>
                  <idno type="IDREF">https://www.idref.fr/24020011X</idno>
                  <affiliation ref="#struct-460"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Muhammad</forename>
                    <forename type="middle">Hamid</forename>
                    <surname>Raza</surname>
                  </persName>
                  <idno type="halauthorid">3364970-0</idno>
                  <affiliation ref="#struct-220689"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Rong</forename>
                    <surname>Wu</surname>
                  </persName>
                  <idno type="halauthorid">696176-0</idno>
                  <affiliation ref="#struct-220689"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Kilian</forename>
                    <surname>Gruel</surname>
                  </persName>
                  <idno type="halauthorid">2327018-0</idno>
                  <affiliation ref="#struct-460"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Catherine</forename>
                    <surname>Dubourdieu</surname>
                  </persName>
                  <email type="md5">5c98d1117f9b1071dd3eb5c6cb39b045</email>
                  <email type="domain">helmholtz-berlin.de</email>
                  <idno type="idhal" notation="numeric">1278898</idno>
                  <idno type="halauthorid" notation="string">808834-1278898</idno>
                  <idno type="ORCID">https://orcid.org/0000-0002-4642-6897</idno>
                  <affiliation ref="#struct-220689"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Martin</forename>
                    <surname>Hÿtch</surname>
                  </persName>
                  <email type="md5">28afb1ae02a002a8f624a75a1689b343</email>
                  <email type="domain">cemes.fr</email>
                  <idno type="idhal" notation="string">martin-hytch</idno>
                  <idno type="idhal" notation="numeric">17686</idno>
                  <idno type="halauthorid" notation="string">33052-17686</idno>
                  <idno type="ORCID">https://orcid.org/0000-0002-9099-0129</idno>
                  <idno type="IDREF">https://www.idref.fr/131509829</idno>
                  <affiliation ref="#struct-519177"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Christophe</forename>
                    <surname>Gatel</surname>
                  </persName>
                  <email type="md5">29f68dd938c7e2c52d67ab2c52b9d5c2</email>
                  <email type="domain">cemes.fr</email>
                  <idno type="idhal" notation="string">christophe-gatel</idno>
                  <idno type="idhal" notation="numeric">11804</idno>
                  <idno type="halauthorid" notation="string">1148-11804</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/F-6046-2014</idno>
                  <idno type="ORCID">https://orcid.org/0000-0001-5549-7008</idno>
                  <idno type="IDREF">https://www.idref.fr/08954840X</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/F-6046-2014</idno>
                  <affiliation ref="#struct-519177"/>
                </author>
              </analytic>
              <monogr>
                <idno type="halJournalId" status="VALID">9661</idno>
                <idno type="issn">0935-9648</idno>
                <idno type="eissn">1521-4095</idno>
                <title level="j">Advanced Materials</title>
                <imprint>
                  <publisher>Wiley-VCH Verlag</publisher>
                  <date type="datePub">2024-11-25</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1002/adma.202413691</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">Al 2 O 3 HfO 2 interface charge trapping interfacial layers nanocapacitor operando electron holography</term>
                <term xml:lang="en">Al 2 O 3</term>
                <term xml:lang="en">HfO 2</term>
                <term xml:lang="en">interface charge trapping</term>
                <term xml:lang="en">interfacial layers</term>
                <term xml:lang="en">nanocapacitor</term>
                <term xml:lang="en">operando electron holography</term>
              </keywords>
              <classCode scheme="halDomain" n="phys">Physics [physics]</classCode>
              <classCode scheme="halDomain" n="chim">Chemical Sciences</classCode>
              <classCode scheme="halTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halOldTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halTreeTypology" n="ART">Journal articles</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>Interfaces in heterostructures play a major role in the functionality of electronic devices. Phenomena such as charge trapping/detrapping at interfaces under electric field affect the dynamics of metal/oxide/metal capacitors and metal/oxide/semiconductor transistors used for memory and logic applications. Charge traps are also key for the stabilization of a ferroelectric polarization and its ability to switch in ferroelectric devices such as ferroelectric tunnel junctions (FTJs). However, electric-field induced charging phenomena remain unclear even in conventional dielectric heterostructures due to a lack of direct measurement methods. Here, it is shown how operando off-axis electron holography can be used to quantify the charges trapped at the dielectric/dielectric interfaces as well as metal/dielectric interfaces in HfO 2 -and Al 2 O 3 -based nanocapacitors. By mapping the electrostatic potential at sub-nanometer spatial resolution while applying a bias, it is demonstrated that these interfaces present a high density of trapped charges, which strongly influence the electric field distribution within the device. The unprecedented sensitivity of the electron holography experiments coupled with numerical simulations highlights for the first time the linear relationship between the trapped charges at each interface and the applied bias, and the effect of the trapped charges on the local electrical behavior.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-460" status="OLD">
          <idno type="IdRef">157408132</idno>
          <idno type="ISNI">0000 0000 9254 7345</idno>
          <idno type="RNSR">199117683P</idno>
          <idno type="ROR">https://ror.org/03kwnqq69</idno>
          <orgName>Centre d'élaboration de matériaux et d'études structurales</orgName>
          <orgName type="acronym">CEMES</orgName>
          <date type="start">1988-01-01</date>
          <date type="end">2025-01-01</date>
          <desc>
            <address>
              <addrLine>29 Rue Jeanne Marvig - BP 94347 31055 TOULOUSE CEDEX 4</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.cemes.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-116255" type="direct"/>
            <relation active="#struct-301232" type="indirect"/>
            <relation active="#struct-443875" type="indirect"/>
            <relation active="#struct-159253" type="direct"/>
            <relation active="#struct-67872" type="indirect"/>
            <relation active="#struct-217752" type="direct"/>
            <relation active="#struct-341038" type="indirect"/>
            <relation name="UAR2599 / FR2599" active="#struct-441569" type="direct"/>
            <relation active="#struct-448187" type="indirect"/>
            <relation name="UPR8011" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-220689" status="VALID">
          <idno type="IdRef">167020544</idno>
          <idno type="ISNI">0000000110903682</idno>
          <idno type="ROR">https://ror.org/02aj13c28</idno>
          <idno type="Wikidata">Q314578</idno>
          <orgName>Helmholtz-Zentrum Berlin für Materialien und Energie GmbH = Helmholtz Centre Berlin for Materials and Energy = Centre Helmholtz de Berlin pour les matériaux et l'énergie</orgName>
          <orgName type="acronym">HZB</orgName>
          <date type="start">2009-01-01</date>
          <desc>
            <address>
              <addrLine>Hahn-Meitner-Platz 1, 14109 Berlin, Bundesrepublik Deutschland</addrLine>
              <country key="DE"/>
            </address>
            <ref type="url">http://www.helmholtz-berlin.de</ref>
          </desc>
          <listRelation>
            <relation active="#struct-300461" type="direct"/>
          </listRelation>
        </org>
        <org type="researchteam" xml:id="struct-519177" status="OLD">
          <orgName>Interférométrie, In situ et Instrumentation pour la Microscopie Electronique</orgName>
          <orgName type="acronym">CEMES-I3EM</orgName>
          <date type="end">2025-01-01</date>
          <desc>
            <address>
              <addrLine>CEMES 29 rue Jeanne Marvig, BP 94347, F-31055 Toulouse Cedex 4</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.cemes.fr/I3EM-Interferometrie-In-situ-et</ref>
          </desc>
          <listRelation>
            <relation active="#struct-460" type="direct"/>
            <relation active="#struct-116255" type="indirect"/>
            <relation active="#struct-301232" type="indirect"/>
            <relation active="#struct-443875" type="indirect"/>
            <relation active="#struct-159253" type="indirect"/>
            <relation active="#struct-67872" type="indirect"/>
            <relation active="#struct-217752" type="indirect"/>
            <relation active="#struct-341038" type="indirect"/>
            <relation name="UAR2599 / FR2599" active="#struct-441569" type="indirect"/>
            <relation active="#struct-448187" type="indirect"/>
            <relation name="UPR8011" active="#struct-441569" type="indirect"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-116255" status="VALID">
          <idno type="IdRef">026388766</idno>
          <idno type="ISNI">0000 0001 2286 8343</idno>
          <idno type="ROR">https://ror.org/01h8pf755</idno>
          <idno type="Wikidata">Q858979</idno>
          <orgName>Institut National des Sciences Appliquées - Toulouse</orgName>
          <orgName type="acronym">INSA Toulouse</orgName>
          <date type="start">1963-10-21</date>
          <desc>
            <address>
              <addrLine>135, avenue de Rangueil - 31077 Toulouse cedex 4</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.insa-toulouse.fr</ref>
          </desc>
          <listRelation>
            <relation active="#struct-301232" type="direct"/>
            <relation active="#struct-443875" type="direct"/>
          </listRelation>
        </org>
        <org type="regroupinstitution" xml:id="struct-301232" status="VALID">
          <idno type="IdRef">162105150</idno>
          <orgName>Institut National des Sciences Appliquées</orgName>
          <orgName type="acronym">INSA</orgName>
          <desc>
            <address>
              <country key="FR"/>
            </address>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-443875" status="VALID">
          <idno type="ROR">https://ror.org/017tgbk05</idno>
          <orgName>Communauté d'universités et établissements de Toulouse</orgName>
          <orgName type="acronym">Comue de Toulouse</orgName>
          <desc>
            <address>
              <addrLine>41 Allée Jules Guesde, 31000 Toulouse</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.univ-toulouse.fr/</ref>
          </desc>
        </org>
        <org type="regrouplaboratory" xml:id="struct-159253" status="OLD">
          <idno type="IdRef">240309472</idno>
          <idno type="ISNI">0000 0004 4686 8315</idno>
          <idno type="RNSR">200310667L</idno>
          <orgName>Institut de Chimie de Toulouse</orgName>
          <orgName type="acronym">ICT</orgName>
          <date type="end">2025-01-01</date>
          <desc>
            <address>
              <addrLine>118 Route de Narbonne 31062 Toulouse cédex 9</addrLine>
              <country key="FR"/>
            </address>
          </desc>
          <listRelation>
            <relation active="#struct-67872" type="direct"/>
            <relation active="#struct-217752" type="direct"/>
            <relation active="#struct-443875" type="indirect"/>
            <relation active="#struct-341038" type="direct"/>
            <relation name="UAR2599 / FR2599" active="#struct-441569" type="direct"/>
            <relation active="#struct-448187" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-67872" status="VALID">
          <idno type="IdRef">050165224</idno>
          <idno type="ROR">https://ror.org/05q3vnk25</idno>
          <orgName>Institut de Recherche pour le Développement</orgName>
          <orgName type="acronym">IRD</orgName>
          <desc>
            <address>
              <addrLine>SiègeLe Sextant 44, bd de DunkerqueCS 9000913572 Marseille cedex 02</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.ird.fr/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-217752" status="OLD">
          <idno type="IdRef">026404672</idno>
          <idno type="ISNI">0000000121617331</idno>
          <idno type="ROR">https://ror.org/02v6kpv12</idno>
          <idno type="Wikidata">Q1273188</idno>
          <orgName>Université Toulouse III - Paul Sabatier</orgName>
          <orgName type="acronym">UT3</orgName>
          <date type="end">2025-01-01</date>
          <desc>
            <address>
              <addrLine>118 route de Narbonne - 31062 Toulouse</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.univ-tlse3.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-443875" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-341038" status="VALID">
          <idno type="IdRef">232435103</idno>
          <idno type="ISNI">000000010626358X</idno>
          <idno type="ROR">https://ror.org/02cte4b68</idno>
          <orgName>Institut de Chimie - CNRS Chimie</orgName>
          <orgName type="acronym">INC-CNRS</orgName>
          <date type="start">2009-10-01</date>
          <desc>
            <address>
              <addrLine>CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE3 rue Michel-Ange75794 PARIS CEDEX 16 - France</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.cnrs.fr/inc</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-441569" status="VALID">
          <idno type="IdRef">02636817X</idno>
          <idno type="ISNI">0000000122597504</idno>
          <idno type="ROR">https://ror.org/02feahw73</idno>
          <orgName>Centre National de la Recherche Scientifique</orgName>
          <orgName type="acronym">CNRS</orgName>
          <date type="start">1939-10-19</date>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.cnrs.fr/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-448187" status="VALID">
          <idno type="IdRef">026388820</idno>
          <idno type="ISNI">0000000121766169</idno>
          <idno type="ROR">https://ror.org/033p9g875</idno>
          <orgName>Institut National Polytechnique (Toulouse)</orgName>
          <orgName type="acronym">Toulouse INP</orgName>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.inp-toulouse.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-443875" type="direct"/>
          </listRelation>
        </org>
        <org type="regroupinstitution" xml:id="struct-300461" status="VALID">
          <idno type="IdRef">116042990</idno>
          <idno type="ISNI">0000000119425154</idno>
          <idno type="Wikidata">Q679913</idno>
          <orgName>Helmholtz-Gemeinschaft = Helmholtz Association</orgName>
          <desc>
            <address>
              <addrLine>Anna-Louisa-Karsch-Straße 2, 10178 Berlin</addrLine>
              <country key="DE"/>
            </address>
            <ref type="url">http://www.helmholtz.de/</ref>
          </desc>
        </org>
      </listOrg>
      <listOrg type="projects">
        <org type="anrProject" xml:id="projanr-102945" status="VALID">
          <idno type="anr">ANR-23-CE42-0011</idno>
          <orgName>POLARYS</orgName>
          <desc>Cartographie de la polarisation par holographie électronique</desc>
          <date type="start">2023</date>
        </org>
        <org type="anrProject" xml:id="projanr-53650" status="VALID">
          <idno type="anr">ANR-19-CE24-0027</idno>
          <orgName>FEAT</orgName>
          <desc>Ferroélectriques à l'échelle nanométrique sur silicium</desc>
          <date type="start">2019</date>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>