Development and benchmark of a new analysis method dedicated to transverse beam emittance measurement
Résumé
A recent emittance measurement analysis pointed out the scarce calculation tools to evaluate precisely the method and error calculations. In this paper, a new analysis technique is proposed and compared on realistic beam simulations with the already existing linear regression method. This new analysis method is shown to be easier to implement and provides results with a good level of confidence. Detailed calculations of the errors obtained with an Allison scanner, as well as studies of the errors due to the analysis method, are presented.
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