[Invited] Resistive Scanning Thermal Microscopy for localizing and monitoring defects in electronics - Archive ouverte HAL
Communication Dans Un Congrès Année : 2024

[Invited] Resistive Scanning Thermal Microscopy for localizing and monitoring defects in electronics

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hal-04800703 , version 1 (24-11-2024)

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  • HAL Id : hal-04800703 , version 1

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Séverine Gomés. [Invited] Resistive Scanning Thermal Microscopy for localizing and monitoring defects in electronics. [INVITE] Conférence interne à STMicroelectronics, STMicroelectronics, Oct 2024, Grenoble, France. ⟨hal-04800703⟩
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