Impact Analysis of Control Frequency Variations Using SI MOSFETs and SIC IGBTs in Boost Converter - Archive ouverte HAL
Communication Dans Un Congrès Année : 2024

Impact Analysis of Control Frequency Variations Using SI MOSFETs and SIC IGBTs in Boost Converter

Résumé

This article aims to conduct a comparative study between different types of MOSFETs based on silicon (Si) and IGBTs based on silicon carbide (SiC). Specifically, three MOSFETs (IRF530, IRF630, IRF730) and one IGBT (APT25GF100BN) were analyzed. The study evaluates characteristics such as V DS and V CE voltages, current during transistor turn-on and turn-off, and examines the impact of varying the frequency of the control signal. Transient process data during activation and deactivation were simulated using LTspice software. The analysis focused on their application in a static boost converter to determine conducted emissions in common mode and differential mode. Results indicate that the choice of MOSFET and the switching frequency significantly influence electromagnetic interference (EMI) noise levels.
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hal-04800264 , version 1 (24-11-2024)

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Abdelhakim Zeghoudi, Dorin Lucache, Abdelber Bendaoud, Laurent Canale. Impact Analysis of Control Frequency Variations Using SI MOSFETs and SIC IGBTs in Boost Converter. 2024 IEEE International Conference And Exposition On Electric And Power Engineering (EPEi), IEEE Romanian Section, Oct 2024, Iasi, Romania. pp.193-198, ⟨10.1109/EPEi63510.2024.10758091⟩. ⟨hal-04800264⟩
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