High Speed Millimeter Wave Beam Steering for On-Line Industrial Non Destructive Testing
Résumé
The acquisition speed of millimeter wave and terahertz raster scan imaging system is limited by the inertia of the optical parts moving back and forth in relation to the object to be imaged. This limitation is a major obstacle to the use of this radiation for industrial non-destructive testing (NDT). In this paper, we demonstrate the ability to drastically increase the frame rate thanks to a patent pending beam steering device. This imaging device is compatible with conveyor and allows an acquisition speed of 5000 pixels per second distributed over 25 lines of 250 pixels at millimeter scale resolution.
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