Impact of scaling up the sensor sampling frequency on the reliability of edge processing systems in tolerating soft errors caused by neutrons - Archive ouverte HAL
Communication Dans Un Congrès Année : 2024

Impact of scaling up the sensor sampling frequency on the reliability of edge processing systems in tolerating soft errors caused by neutrons

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Micro et nanotechnologies/Microélectronique

Laurence BEN TITO  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-04739776

Soumis le : mercredi 16 octobre 2024-14:21:39

Dernière modification le : mercredi 23 octobre 2024-10:30:04

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Dates et versions

hal-04739776 , version 1 (16-10-2024)

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Paternité - Pas d'utilisation commerciale

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  • HAL Id : hal-04739776 , version 1

Citer

Matheus Minelli de Carvalho, Luiz Henrique Laurini, Emmanuel Atukpor, Lirida Naviner, Rodrigo Possamai Bastos. Impact of scaling up the sensor sampling frequency on the reliability of edge processing systems in tolerating soft errors caused by neutrons. IEEE Sensors Conference 2024, Oct 2024, Kobe, Japan. ⟨hal-04739776⟩

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