WM-02 Mechanical Investigations for High Frequency Probe Design - Archive ouverte HAL
Communication Dans Un Congrès Année : 2024

WM-02 Mechanical Investigations for High Frequency Probe Design

Résumé

In this presentation, we will explore the mechanical aspects of RF probes via finite element simulation and analytical calculations. We'll also demonstrate the significance of the contact material between the RF probe and the pad, showcasing its impact on high-frequency measurements of an SiGe HBT.
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Dates et versions

hal-04736870 , version 1 (15-10-2024)

Identifiants

  • HAL Id : hal-04736870 , version 1

Citer

Sebastien Fregonese, Tarek Bouzar, Jean-Daniel Arnould, Simon Joly, Thomas Zimmer. WM-02 Mechanical Investigations for High Frequency Probe Design. 2024 European Microwave Week: Workshop: On-wafer measurements and material characterisation for communications and quantum applications, Xiaobang Shang, Nick Ridler, Sep 2024, Paris, France. ⟨hal-04736870⟩
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