Journal Articles Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics Year : 2024

Is the linear relationship between the slope and intercept observed in field emission S-K plots an artifact?

Abstract

The performance of field emitters is usually analyzed by linear fitting of a Fowler–Nordheim plot. It has sometimes been observed that the fitted slopes and intercepts show a strong correlation, but no convincing explanation has been provided. We propose a simple model showing that this correlation is due to fluctuations in the slope and the fact that the experiments are carried out over a defined range of voltage and current. By performing a meta-analysis, we show that this explanation correctly predicts the results of other groups in this field.
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Dates and versions

hal-04732320 , version 1 (15-10-2024)

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Anthony Ayari, Pascal Vincent, Sorin Perisanu, Philippe Poncharal, Stephen Purcell. Is the linear relationship between the slope and intercept observed in field emission S-K plots an artifact?. Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, 2024, 42 (5), pp.053201. ⟨10.1116/6.0003828⟩. ⟨hal-04732320⟩
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