Capture the Pulse: Impact of FPGA Resource Utilization on EM Fault Injection Attacks Detection - Archive ouverte HAL
Communication Dans Un Congrès Année : 2024

Capture the Pulse: Impact of FPGA Resource Utilization on EM Fault Injection Attacks Detection

Résumé

With the increasing use of Field-Programmable Gate Arrays (FPGAs) in critical applications, safeguarding against malicious attacks becomes necessary. ElectroMagnetic Fault Injection (EMFI) stands out as a potent threat among localized fault attacks with its optimal compromise between cost and effectiveness, without the risk of damaging the target chip. Among potential targets, Ring Oscillators (ROs) are critical components that can be used in secure primitives, as well as detectors against physical attacks. In this paper, we analyze how the use of FPGA resources affects the outcome of EMFI attacks: we experimentally show with single EM pulse injections on three families of Xilinx FPGAs manufactured in 28nm process technology that the harmonic response of a RO heavily depends on its layout and density within the FPGA die. We also highlight the need of considering both EM pulse polarities when evaluating the efficiency of any proposed countermeasures, as this can reveal different sensitive locations on the chip. These findings can be leveraged for designing architectures that address the EMFI threat more effectively.

Fichier principal
Vignette du fichier
vlsisoc24.pdf (7.21 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-04717585 , version 1 (03-10-2024)

Licence

Identifiants

  • HAL Id : hal-04717585 , version 1

Citer

Sami El Amraoui, Régis Leveugle, Paolo Maistri. Capture the Pulse: Impact of FPGA Resource Utilization on EM Fault Injection Attacks Detection. IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC 2024), Oct 2024, Tanger, Morocco. ⟨hal-04717585⟩
4 Consultations
0 Téléchargements

Partager

More