Optical constants and thickness determination of La 2 / 3 Sr 1 / 3 MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Applied Surface Science Année : 2024

Optical constants and thickness determination of La 2 / 3 Sr 1 / 3 MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques

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hal-04625775 , version 1 (26-06-2024)

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Jérémy Blond, Christian Dufour, Sandeep Kumar Chaluvadi, Sylvain Duprey, Xavier Portier, et al.. Optical constants and thickness determination of La 2 / 3 Sr 1 / 3 MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques. Applied Surface Science, 2024, 669, pp.160489. ⟨10.1016/j.apsusc.2024.160489⟩. ⟨hal-04625775⟩
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