Open Testing and Measurement Bench for UHF RFID - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2023

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hal-04520503 , version 1 (25-03-2024)

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Nicolas Barbot, Vinisha V. Open Testing and Measurement Bench for UHF RFID. 2023 IEEE International Conference on RFID Technology and Applications (RFID-TA), Sep 2023, Aveiro, France. pp.158-161, ⟨10.1109/RFID-TA58140.2023.10290285⟩. ⟨hal-04520503⟩

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