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Article Dans Une Revue IEEE Transactions on Industrial Electronics Année : 2023

All-Pass NGD FIR Original Study for Sensor Failure Detection Application

Blaise Ravelo
Wenceslas Rahajandraibe

Résumé

This paper deals with original design, implementation, test, and potential application of finite impulse response (FIR) with uncommon all-pass negative group delay (AP-NGD) circuit. The counterintuitive AP-NGD numerical circuit theory is established. Design method of first order AP-NGD circuit is introduced with respect to the specified time-advance. The first order difference equation was synthesized, designed, and implemented in STM32® Microcontroller Unit, and experimented to validate the AP-NGD characteristics. The AP-NGD FIR prototype was tested in the time-domain with Gaussian and arbitrary waveform sensored signals. Calculated and experimented results in very good agreement with the most significant timeadvance-10 s ever experimented before are obtained. The potential industrial application of the NGD predictor for sensor fault diagnosis in real-time is described. Index Terms-Numerical circuit design, Negative group delay (NGD) function, Finite Impulse Response (FIR), Timedomain test, All-pass NGD (AP-NGD), NGD numerical circuit, NGD predictor, sensor fault diagnosis.
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Dates et versions

hal-04475053 , version 1 (23-02-2024)

Identifiants

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Blaise Ravelo, Mathieu Guerin, Wenceslas Rahajandraibe, Lala Rajaoarisoa. All-Pass NGD FIR Original Study for Sensor Failure Detection Application. IEEE Transactions on Industrial Electronics, 2023, 70 (9), pp.9561-9571. ⟨10.1109/TIE.2022.3213904⟩. ⟨hal-04475053⟩
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