Photoluminescence imaging has become a standard method to characterize solar cells. However, performing some quantitative analysis of this technique requires the assumption of uniform local absorptivity, which cannot be directly measured using traditional methods. This study presents a novel approach to measure the local relative absorptivity over a broad spectral range for a perovskite absorber deposited on a charge extraction layer and an electrode. By analyzing the photoluminescence intensity as a function of the incident photon energy, we were able to determine the relative absorptivity of the incident light above the bandgap energy. Additionally, luminescence spectra allow us to accurately assess the absorptivity near the bandgap energy from the reciprocity between absorption and emission. Reflectivity measurements were also performed to further understand the possible limitations of our experiment and to discuss our results. Finally, this method was able to distinguish between variations in the photoluminescence response caused by slight differences in the local film thickness and changes in the local carrier lifetime.