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Communication Dans Un Congrès Année : 2023

Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring

Résumé

In a system-level test of electronics, the monitoring of total current consumption combined with other observations improves the analysis of system performance and allows for more efficient identification of radiationinduced errors during the test execution. I. INTRODUCTION

Domaines

Electronique
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Dates et versions

hal-04266900 , version 1 (31-10-2023)

Identifiants

  • HAL Id : hal-04266900 , version 1

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Ivan Slipukhin, Andrea Coronetti, Rubén García Alía, Frédéric Saigné, Jérôme Boch, et al.. Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring. 2023 European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France. ⟨hal-04266900⟩
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