Determination of the interdiffusion coefficient at low temperature in Ni/NiCr nanometer-scale multilayers using X-ray reflectivity
Résumé
The interdiffusion coefficient in the Ni/Cr system was determined
at low temperature using Ni/Ni 0.78 Cr 0.22 nanometer-scale
multilayers with periods of 3.65 and 4.50 nm. X-ray reflectivity
measurements were carried out to monitor the 1st Bragg peak
intensity with annealing time, at both 400 and 450 °C temperatures.
The obtained kinetics of the composition modulation decay allowed
determining the interdiffusion coefficients of the uniform final
solid solution, Ni 0.89 Cr 0.11 . Values in the order of 10 − 21 to
10 -20 cm 2 .s − 1 at 400 °C and 450 °C, respectively, were found,
in line with extrapolations from data of Cr diffusion obtained at
higher temperature.
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