Article Dans Une Revue IEEE Design & Test Année : 2023

Side Channel and Fault Analyses on Memristor-Based Logic In-Memory

Résumé

In-memory computing is a promising approach to address the challenges faced by traditional computing architectures, such as the memory wall and the energy consumption of data transfer. By storing and processing data entirely in main memory, in-memory computing can offer significant improvements in performance and scalability. This solution might also bring more security, thanks to the limited data movement which mitigates the risk of information leakage via the communication buses. In this paper, we present the results of side-channel and fault analyses on one of the most researched solutions for logic-in-memory based on memristive memory arrays. Our results show that both analyses can easily reveal secret information.

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hal-04252272 , version 1 (20-10-2023)

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Pietro Inglese, Ioana Vatajelu, Giorgio Di Natale. Side Channel and Fault Analyses on Memristor-Based Logic In-Memory. IEEE Design & Test, 2023, ⟨10.1109/MDAT.2023.3324522⟩. ⟨hal-04252272⟩
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