In situ mapping of the vectorial electric field within a nanocrystal-based focal plane array using photoemission microscopy - Archive ouverte HAL
Article Dans Une Revue ACS Applied Electronic Materials Année : 2023

In situ mapping of the vectorial electric field within a nanocrystal-based focal plane array using photoemission microscopy

Adrien Khalili
Erwan Bossavit
Tung Huu Dang
Huichen Zhang
Nicolas Ledos
Yoann Prado
Mathieu Silly
  • Fonction : Auteur
Pavel Dudin
  • Fonction : Auteur
Jose Avila
  • Fonction : Auteur

Résumé

Within a few years, nanocrystal-based infrared devices have achieved significant progress and advancements, including high-quality imaging systems. This raises the need to develop tools that can probe the device's active material in situ and in operando to gain a deeper understanding of their operation beyond the overall response of the device. Here, we investigate a shortwave infrared imager based on HgTe nanocrystals with photoconductive operation, which now proposes imaging at wavelengths beyond the traditional InGaAs technology. We demonstrate that we can use photoemission microscopy to probe the energy landscape of this imaging array. Finally, we further use the high spatial resolution of the method to get access to the vectorial distribution of the electric field.
Fichier principal
Vignette du fichier
Pixels_v20.pdf (777.18 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-04172822 , version 1 (28-07-2023)

Identifiants

Citer

Adrien Khalili, Mariarosa Cavallo, Erwan Bossavit, Rodolphe Alchaar, Tung Huu Dang, et al.. In situ mapping of the vectorial electric field within a nanocrystal-based focal plane array using photoemission microscopy. ACS Applied Electronic Materials, In press, ⟨10.1021/acsaelm.3c00609⟩. ⟨hal-04172822⟩
63 Consultations
31 Téléchargements

Altmetric

Partager

More