Optimization of free space test bench in the J band for material characterization applications - Archive ouverte HAL
Communication Dans Un Congrès Année : 2023

Optimization of free space test bench in the J band for material characterization applications

Alain Peden
Daniel Bourreau
Gregory Gaudin
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hal-04164297 , version 1 (18-07-2023)

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  • HAL Id : hal-04164297 , version 1

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Alain Peden, Daniel Bourreau, Gregory Gaudin. Optimization of free space test bench in the J band for material characterization applications. EuMW 2023: 53rd European Microwave Conference, Sep 2023, Berlin, Germany. ⟨hal-04164297⟩
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