Identification of stress factors and degradation mechanisms inducing DCR drift in SPADs - Archive ouverte HAL
Communication Dans Un Congrès Année : 2022
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hal-04138806 , version 1 (23-06-2023)

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Mathieu Sicre, Xavier Federspiel, David Roy, Bastien Mamby, Caroline Coutier, et al.. Identification of stress factors and degradation mechanisms inducing DCR drift in SPADs. 2022 IEEE International Integrated Reliability Workshop (IIRW), Oct 2022, South Lake Tahoe, United States. pp.1-5, ⟨10.1109/IIRW56459.2022.10032759⟩. ⟨hal-04138806⟩
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