Low-coherence interferometric measurement of the spatial frequency dependence of the light field backscattered by optical interfaces - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Applied Physics Letters Année : 2023

Low-coherence interferometric measurement of the spatial frequency dependence of the light field backscattered by optical interfaces

M Lequime
  • Fonction : Auteur
I Khan
  • Fonction : Auteur
A Bolliand
  • Fonction : Auteur
M Zerrad
  • Fonction : Auteur
C Amra
  • Fonction : Auteur

Résumé

In this paper, we show how the combined use of low-coherence interferometry, balanced detection, and data processing comparable to that used in Fourier transform spectrometry allows us to characterize with ultimate resolutions (sub-parts per million in level, 0.2 nm in wavelength, and 25 mdeg in angle) the retro-reflection and retro-scattering response of both sides of a 2 mm thick silica wafer.

Dates et versions

hal-04135679 , version 1 (21-06-2023)

Identifiants

Citer

M Lequime, I Khan, A Bolliand, M Zerrad, C Amra. Low-coherence interferometric measurement of the spatial frequency dependence of the light field backscattered by optical interfaces. Applied Physics Letters, 2023, 122 (19), pp.191103. ⟨10.1063/5.0139822⟩. ⟨hal-04135679⟩
22 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More