An ellipsoid‐based framework for fault estimation and remaining useful life prognosis

Wenhan Zhang; Zhenhua Wang; Tarek Raïssi; Rong Su

doi:10.1002/rnc.6749

Journal Articles International Journal of Robust and Nonlinear Control Year : 2023

An ellipsoid‐based framework for fault estimation and remaining useful life prognosis

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Wenhan Zhang

Function : Author
PersonId : 1209249
ORCID : 0000-0003-4552-3780

Harbin Institute of Technology

Zhenhua Wang

Function : Author
PersonId : 770584
ORCID : 0000-0003-4923-9381

Harbin Institute of Technology

Tarek Raïssi

Function : Author
PersonId : 181611
IdHAL : tarek-raissi
ORCID : 0000-0002-8735-9395
IdRef : 084518987

CEDRIC. Traitement du signal et architectures électroniques

Rong Su

Function : Author
PersonId : 1252251
ORCID : 0000-0003-3448-0586

Nanyang Technological University [Singapour]

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Tarek Raissi : Connect in order to contact the contributor

https://hal.science/hal-04090060

Submitted on : Friday, May 5, 2023-11:48:25 AM

Last modification on : Tuesday, October 8, 2024-1:00:04 PM

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hal-04090060 , version 1 (05-05-2023)

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HAL Id : hal-04090060 , version 1
DOI : 10.1002/rnc.6749

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Wenhan Zhang, Zhenhua Wang, Tarek Raïssi, Rong Su. An ellipsoid‐based framework for fault estimation and remaining useful life prognosis. International Journal of Robust and Nonlinear Control, 2023, 33 (12), pp.7260-7281. ⟨10.1002/rnc.6749⟩. ⟨hal-04090060⟩

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An ellipsoid‐based framework for fault estimation and remaining useful life prognosis

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