Terahertz generation through optical rectification in reflection - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Applied Physics Année : 2023

Terahertz generation through optical rectification in reflection

Résumé

In this paper, we study terahertz generation through optical rectification in reflection at normal incidence in a dielectric nonlinear crystal. We first analyze, with a nonlinear optical model, the sample parameters (thickness, absorption at both laser and terahertz wavelengths, etc.) for which a terahertz optical rectification reflection scheme is preferable to the common transmission scheme. Then, we report our experimental observations of a reflected terahertz signal generated at the surface of a ZnTe crystal. The reflected terahertz signal shares all the characteristics of a signal generated in transmission but is not limited by absorption losses in the crystal, thereby providing a broader bandwidth. At high pump laser power, the signal exhibits saturation, which is caused by the decrease of the nonlinear susceptibility due to photocarriers generated by two-photon absorption. This reflection scheme could be of great importance for terahertz microscopy of opaque materials like, e.g., humid samples or samples exhibiting strong absorption bands or to study samples for which the transmitted signal cannot be recorded.

Dates et versions

hal-04086350 , version 1 (02-05-2023)

Identifiants

Citer

Mathias Hedegaard Kristensen, Emilie Hérault, Dongwei Zhai, Esben Skovsen, Jean-Louis Coutaz. Terahertz generation through optical rectification in reflection. Journal of Applied Physics, 2023, 133 (17), ⟨10.1063/5.0144433⟩. ⟨hal-04086350⟩
13 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More