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Patents Year : 2020

Calibration standard for evanescence microscopy

Abstract

The invention relates to a calibration standard for determining an information related to an evanescent field generated close to the interface between a sample to be tested and a substrate on which said sample is to be deposited, preparation methods and use thereof.
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Dates and versions

hal-04077832 , version 1 (21-04-2023)

Identifiers

  • HAL Id : hal-04077832 , version 1

Cite

Martin Oheim, Adi Salomon. Calibration standard for evanescence microscopy. France, Patent n° : EP3623796A1. 2020. ⟨hal-04077832⟩

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