Methodology for active Junction profile extraction in thin film FD-SOI enabling performance driver identification in 500°C devices for 3D sequential integration
Résumé
We present, for the first time, a new CV based technique to extract the Active Dopant Profile under the spacer in thin film FDSOI devices (CV-AJP). The methodology is successfully applied to FDSOI devices fabricated at 500°C for 3D sequential integration. It shows that the ION/ IOFF trade-off relies mainly on the chemical dopant introduction below the offset spacer, as the activation level obtained with thermal activation is found to be high enough. The LT device demonstrated in this work, already outperforms the literature. The active profile extraction also allows to draw guidelines for further device performance improvement: using a scaled SiCO spacer (5,5nm) allows to circumvent the negligible dopant diffusion at 500°C without dynamic performance penalty due to its low-k dielectric value
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